Circuit-Breaker Automated Failure Tracking Based on Coil Current Signature

被引:71
作者
Razi-Kazemi, Ali Asghar [1 ,2 ]
Vakilian, Mehdi [1 ,2 ]
Niayesh, Kaveh [3 ]
Lehtonen, Matti [4 ]
机构
[1] Sharif Univ Technol, Dept Elect Engn, Tehran 11365, Iran
[2] Ctr Excellence Power Syst Management & Control, Tehran 11365, Iran
[3] Univ Tehran, Sch Elect & Comp Engn, Tehran 14395, Iran
[4] Aalto Univ, Dept Elect Engn, FI-00076 Helsinki, Finland
关键词
Circuit breaker (CB); condition monitoring; fault diagnosis; maintenance; MAINTENANCE;
D O I
10.1109/TPWRD.2013.2276630
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The online condition assessment of circuit breakers (CBs) has been increasingly requested by power utilities in recent years. Trip and close coil current (CC) signature is an effective and noninvasive parameter in CB online condition monitoring. This paper gives an insight into the impacts of the various failures on the coil current waveform, as well as on the CB operation time. The failures and their causes are categorized based on the outcome of these investigations. Finally, a new algorithm using trip/close CC is proposed to detect the mode and cause of CB incipient failures. In this study, the CC patterns are acquired by measurements carried out on (healthy and faulty) CBs of 72.5-kV and 24-kV rating voltages, having SF6 insulation medium, and are equipped with a spring-drive mechanism.
引用
收藏
页码:283 / 290
页数:8
相关论文
共 27 条
  • [1] [Anonymous], 1998, 4931997 IEEE
  • [2] [Anonymous], 2008, P TRANSM DISTR C EXP
  • [3] [Anonymous], P IEEE POW ENG SOC G
  • [4] Balzer G., 2004, P CIGRE SESS
  • [5] Beattie S., 1996, P MON COND ASS EQ C, P1
  • [6] CIGRE Working Group, 1994, 83 CIGRE WORK GROUP
  • [7] Substation Maintenance Strategy Adaptation for Life-Cycle Cost Reduction Using Genetic Algorithm
    Hinow, Martin
    Mevissen, Martin
    [J]. IEEE TRANSACTIONS ON POWER DELIVERY, 2011, 26 (01) : 197 - 204
  • [8] Research on the condition parameter tester of high voltage circuit breakers
    Hu Xiaoguang
    Lv Chao
    [J]. ICIEA 2008: 3RD IEEE CONFERENCE ON INDUSTRIAL ELECTRONICS AND APPLICATIONS, PROCEEDINGS, VOLS 1-3, 2008, : 2389 - +
  • [9] Huang Jian, 2010, 2010 5th IEEE Conference on Industrial Electronics and Applications (ICIEA 2010), P560, DOI 10.1109/ICIEA.2010.5517076
  • [10] Huang XB, 2011, 2011 INTERNATIONAL CONFERENCE ON ELECTRONICS, COMMUNICATIONS AND CONTROL (ICECC), P3646, DOI 10.1109/ICECC.2011.6066514