Within-project and cross-project just-in-time defect prediction based on denoising autoencoder and convolutional neural network

被引:39
作者
Zhu, Kun [1 ]
Zhang, Nana [1 ]
Ying, Shi [1 ]
Zhu, Dandan [2 ]
机构
[1] Wuhan Univ, Sch Comp Sci, 299 Bayi Rd, Wuhan, Peoples R China
[2] Shanghai Jiao Tong Univ, Artificial Intelligence Inst, 800 Dongchuan Rd, Shanghai, Peoples R China
基金
美国国家科学基金会;
关键词
neural nets; learning (artificial intelligence); denoising autoencoder; software defect prediction; basic defect features; mainstream deep learning techniques; just-in-time defect prediction model; autoencoder convolutional neural network; convolution neural network; cross-project defect prediction experiments; CODE CHURN; COMPLEXITY;
D O I
10.1049/iet-sen.2019.0278
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Just-in-time defect prediction is an important and useful branch in software defect prediction. At present, deep learning is a research hotspot in the field of artificial intelligence, which can combine basic defect features into deep semantic features and make up for the shortcomings of machine learning algorithms. However, the mainstream deep learning techniques have not been applied yet in just-in-time defect prediction. Therefore, the authors propose a novel just-in-time defect prediction model named DAECNN-JDP based on denoising autoencoder and convolutional neural network in this study, which has three main advantages: (i) Different weights for the position vector of each dimension feature are set, which can be automatically trained by adaptive trainable vector. (ii) Through the training of denoising autoencoder, the input features that are not contaminated by noise can be obtained, thus learning more robust feature representation. (iii) The authors leverage a powerful representation-learning technique, convolution neural network, to construct the basic change features into the abstract deep semantic features. To evaluate the performance of the DAECNN-JDP model, they conduct extensive within-project and cross-project defect prediction experiments on six large open source projects. The experimental results demonstrate that the superiority of DAECNN-JDP on five evaluation metrics.
引用
收藏
页码:185 / 202
页数:18
相关论文
共 40 条
  • [11] Identifying self-admitted technical debt in open source projects using text mining
    Huang, Qiao
    Shihab, Emad
    Xia, Xin
    Lo, David
    Li, Shanping
    [J]. EMPIRICAL SOFTWARE ENGINEERING, 2018, 23 (01) : 418 - 451
  • [12] Revisiting supervised and unsupervised models for effort-aware just-in-time defect prediction
    Huang, Qiao
    Xia, Xin
    Lo, David
    [J]. EMPIRICAL SOFTWARE ENGINEERING, 2019, 24 (05) : 2823 - 2862
  • [13] Huo X., 2016, P INT JOINT C ART IN
  • [14] A Convolutional Neural Network for Modelling Sentences
    Kalchbrenner, Nal
    Grefenstette, Edward
    Blunsom, Phil
    [J]. PROCEEDINGS OF THE 52ND ANNUAL MEETING OF THE ASSOCIATION FOR COMPUTATIONAL LINGUISTICS, VOL 1, 2014, : 655 - 665
  • [15] Studying just-in-time defect prediction using cross-project models
    Kamei, Yasutaka
    Fukushima, Takafumi
    McIntosh, Shane
    Yamashita, Kazuhiro
    Ubayashi, Naoyasu
    Hassan, Ahmed E.
    [J]. EMPIRICAL SOFTWARE ENGINEERING, 2016, 21 (05) : 2072 - 2106
  • [16] A Large-Scale Empirical Study of Just-in-Time Quality Assurance
    Kamei, Yasutaka
    Shihab, Emad
    Adams, Bram
    Hassan, Ahmed E.
    Mockus, Audris
    Sinha, Anand
    Ubayashi, Naoyasu
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2013, 39 (06) : 757 - 773
  • [17] Karpathy A, 2015, PROC CVPR IEEE, P3128, DOI 10.1109/CVPR.2015.7298932
  • [18] An Investigation into the Functional Form of the Size-Defect Relationship for Software Modules
    Koru, A. Guenes
    Zhang, Dongsong
    El Emam, Khaled
    Liu, Hongfang
    [J]. IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2009, 35 (02) : 293 - 304
  • [19] Feature learning from incomplete EEG with denoising autoencoder
    Li, Junhua
    Struzik, Zbigniew
    Zhang, Liqing
    Cichocki, Andrzej
    [J]. NEUROCOMPUTING, 2015, 165 : 23 - 31
  • [20] Liu J., 2019, ACM IEEE INT S EMP S