Transmission eigenvalues and the nondestructive testing of dielectrics

被引：68

作者：

Cakoni, Fioralba ^{[1
]}

Cayoeren, Mehmet ^{[2
]}

Colton, David ^{[1
]}

机构：

[1] Univ Delaware, Dept Math Sci, Newark, DE 19716 USA

[2] Istanbul Tech Univ, Elect & Elect Engn Fac, TR-34469 Istanbul, Turkey

来源：

INVERSE PROBLEMS | 2008年 / 24卷 / 06期

关键词：

D O I：

10.1088/0266-5611/24/6/065016

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

We show how transmission eigenvalues can be determined from electromagnetic scattering data and used to determine the presence of cavities in a dielectric.

引用

页数：15

共 9 条

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