Single-shot low coherence pointwise measuring interferometer with potential for in-line inspection

被引:9
作者
Hahn, R. [1 ]
Krauter, J. [1 ]
Koerner, K. [1 ]
Gronle, M. [1 ]
Osten, W. [1 ]
机构
[1] Univ Stuttgart, Inst Tech Opt, Pfaffenwaldring 9, D-70569 Stuttgart, Germany
关键词
metrology; optical design of instruments; fringe analysis; mirror system design; mirrors; optical devices; interferometry; WHITE-LIGHT INTERFEROMETRY; DISPERSION; DOMAIN; SPEED; RADAR;
D O I
10.1088/1361-6501/aa52f1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low-coherence-interferometry (LCI) is a well-known optical metrology technique which offers high resolution and a low measurement uncertainty. For the inspection of dynamic and fast processes, single-shot point sensors can show their full capability. Therefore, a new approach of an interferometer is presented, allowing an single-shot acquisition of a LCI signal. The presented concept is based on tilted wavefronts to generate a spatial modulated interferogram. Using a three faceted mirror (TFM) in the reference path, a virtual field point is generated leading to a tilted planar reference wavefront in the pupil plane of the telecentric objective lens. Three mirror surfaces, which are diamond milled out of a monolithic copper cube, are applied to guarantee a stable TFM geometry, resulting in an invariant reference field point position.
引用
收藏
页数:13
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