Packaging-compatible wafer level capping of MEMS devices

被引:14
作者
Saha, Rajarshi [1 ]
Fritz, Nathan [1 ]
Bidstrup-Allen, Sue Ann [1 ]
Kohl, Paul A. [1 ]
机构
[1] Georgia Inst Technol, Sch Chem & Biomol Engn, Atlanta, GA 30332 USA
关键词
MEMS; Packaging; Air-cavity; ACOUSTIC-WAVE RESONATORS; LOW-IMPEDANCE VHF; CARBON-DIOXIDE;
D O I
10.1016/j.mee.2012.11.010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A cost-effective, wafer-level package process for microelectromechanical devices (MEMS) is presented. The movable part of MEMS device is encapsulated and protected while in wafer form so that commodity, lead-frame packaging can be used. A polymer epoxycyclohexyl polyhedral oligomericsilsesquioxanes has been used as a mask material to pattern the sacrificial polymer as well as overcoat the air-cavity. The resulting air-cavities are clean, debris-free, and robust. The cavities have substantial strength to withstand molding pressures during lead-frame packaging of the MEMS devices. A wide range of cavities from 20 mu m x 400 mu m to 300 mu m x 400 mu m have been fabricated and shown to be mechanically stable. These could potentially house MEMS devices over a wide range of sizes. The strength of the cavities has been investigated using nano-indentation and modeled using analytical and finite element techniques. Capacitive resonators packaged using this protocol have shown clean sensing electrodes and good functionality. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:75 / 84
页数:10
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