A low-loss built-in current sensor

被引：4

作者：

Miura, Y ^{[1
]}

Yamazaki, H ^{[1
]}

机构：

[1] Tokyo Metropolitan Univ, Grad Sch Engn, Tokyo 1920397, Japan

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1999年 / 14卷 / 1-2期

关键词：

built-in current sensor; I-DDQ testing; low-voltage LSIs; multiple power supplies;

D O I：

10.1023/A:1008393104650

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a novel built-in current sensor that uses two additional power supply voltages besides the system power supply voltage, and that is constructed by using a current mirror circuit to pick up an abnormal I-DDQ. It is activated only by an abnormal quiescent power supply current and minimizes the voltage drop at the terminal of the circuit under test. Simulation results showed that it could detect 16-mu A I-DDQ against 0.03-V voltage drop at 3.3-V V-DD and that it reduced performance degradation in the circuit under test. It is therefore suitable for testing low-voltage integrated circuits. Moreover, we verified the behavior of the sensor circuit implemented on the board by using discrete devices. Experimental results showed that the real circuit of the sensor functioned properly.

引用

页码：39 / 48

页数：10