New measuring techniques for the investigation of thermoelectric properties of nanowires

被引:0
作者
Schmitt, M. C. [1 ]
Reith, H. [1 ]
Huzel, D. [1 ]
Voelklein, F. [1 ]
机构
[1] RheinMain Univ Appl Sci Wiesbaden, Inst Microtechnol IMtech, D-65428 Russelsheim, Germany
来源
9TH EUROPEAN CONFERENCE ON THERMOELECTRICS (ECT2011) | 2012年 / 1449卷
关键词
nanowires; thermoelectric properties; measuring techniques; TRANSPORT;
D O I
10.1063/1.4731577
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper focuses on the determination of thermal and electrical transport properties of individual nanowires, preferably thermoelectric bismuth and bismuth compound nanowires, prepared by ion-track-technology. Also the thermoelectric parameters S, sigma, lambda, z (with S: Seebeck coefficient; sigma: electrical conductivity; lambda: thermal conductivity; z: thermoelectric efficiency) of template-embedded nanowire arrays have been investigated. For measurements of S, sigma, lambda, and z specially designed microchips have been developed and employed. The microfabricated z-chip is designed and optimized to determine all thermoelectric parameters on one and the same individual nanowire.
引用
收藏
页码:385 / 388
页数:4
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