Electronic Structures and Carrier Distributions of T-Shaped AlxGa1-xAs/AlyGa1-yAs Quantum Wires Fabricated by a Cleaved-Edge Overgrowth Method

被引:14
作者
Kim, D. H. [1 ]
You, J. H. [1 ]
Kim, J. H. [2 ]
Yoo, K. H. [3 ,4 ]
Kim, T. W. [1 ]
机构
[1] Hanyang Univ, Dept Elect & Comp Engn, Seoul 133791, South Korea
[2] Samsung Elect Co Ltd, CAE Team, Semicond R&D Ctr, Gyeonggi Do 446711, South Korea
[3] Kyung Hee Univ, Dept Phys, Seoul 137701, South Korea
[4] Kyung Hee Univ, Res Inst Basic Sci, Seoul 137701, South Korea
基金
新加坡国家研究基金会;
关键词
T-Shaped AlxGa1-xAs/AlyGa1-y As Quantum Wire; Probabilistic Electron Confinement; Deformation Potential; Interband Transition; CONFINEMENT; WELLS; GAS;
D O I
10.1166/jnn.2012.6391
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The electronic structures and carrier distributions of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As quantum wire (QWR) consisting of crossed arm and stem wells were numerically calculated by using a finite-difference method (FDM). The electronic subband energies in the arm and the stem wells were numerically calculated by using the FDM taking into account two-band Hamiltonian systems considering with and without strain and nonparabolicity effects. The band deformation due to strain and the probabilistic electron confinement of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As QWRs were also calculated. The transition energy from the ground heavy-hole state (HH1) to the ground electron state (E-1) was 1.584 eV when the strain was not considered and 1.585 eV when the strain effects were included. The excitonic peak energies corresponding to the interband transitions (E-1-HH1) in the T-shaped QWRs determined from the photoluminescence spectra were compared favorably with those determined from the FDM calculations.
引用
收藏
页码:5687 / 5690
页数:4
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