Adaptive Atomic Force Microscope

被引：1

作者：

Schmidt, Patrick D. ^{[1
,2
]}

Reichert, Benjamin H. ^{[2
]}

Lajoie, John G. ^{[3
]}

Sivasankar, Sanjeevi ^{[1
]}

机构：

[1] Univ Calif Davis, Dept Biomed Engn, Davis, CA 95616 USA

[2] Iowa State Univ, Dept Elect & Comp Engn, Ames, IA 50011 USA

[3] Iowa State Univ, Dept Phys & Astron, Ames, IA 50011 USA

来源：

SINGLE MOLECULE SPECTROSCOPY AND SUPERRESOLUTION IMAGING XIII | 2020年 / 11246卷

基金：

美国国家卫生研究院;

关键词：

Atomic Force Microscope; AFM; High Bandwidth; Adjustable Sensitivity; Large Range; Single Molecule; Cell Probe; Manipulation; SINGLE; LOCALIZATION;

D O I：

10.1117/12.2545261

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100 mu m in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.

引用

页数：7

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