Major factors to the solder joint strength of ENIG layer in FCBGA package

被引:27
作者
Lee, Dong-Jun [1 ]
Lee, Hyo S. [1 ]
机构
[1] Samsung Electro Mech Co Ltd, Chungcheongnam 339702, South Korea
关键词
D O I
10.1016/j.microrel.2005.08.006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Since electroless nickel and immersion gold (ENIG) process was implemented as the surface finish of printed circuit board (PCB) substrate, there have been lots of reports on the brittle fracture between the Ni-P (phosphorous) layer and solder which results in the poor solder joint strength performance. Galvanic corrosion during immersion Au plating process and P-content in Ni-P layer were considered as major factors in the solder joint strength of ENIG layer in this investigation. The attempt to reduce the galvanic corrosion attack in Ni-P layer was made by changing immersion Au plating process to partial electroless Au plating process. Reducing the galvanic corrosion attack was proved to be effective to improve the solder joint strength of ENIG layer. Evaluation of the solder joint performances in variation with the thickness of the Ni layer leads to the conclusion that the thicker Ni layer has the better solder joint strength performances. The result also showed that higher P-content in Ni layer is more favorable to the solder joint strength. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1119 / 1127
页数:9
相关论文
共 15 条
[1]   Reliability study of the electroless Ni-P layer against solder alloy [J].
Alam, MO ;
Chan, YC ;
Hung, KC .
MICROELECTRONICS RELIABILITY, 2002, 42 (07) :1065-1073
[2]  
ALMA MO, 2002, ECTC P, P1650
[3]  
[Anonymous], ELECTROLESS NICKEL P
[4]   The corrosion behavior of Ni-P deposits with high phosphorous contents in brine media [J].
Bai, A ;
Chuang, PY ;
Hu, CC .
MATERIALS CHEMISTRY AND PHYSICS, 2003, 82 (01) :93-100
[5]  
CHAMPAIGN RF, 2003, CIRC ASSEMBLY, P22
[6]  
COYLE RJ, 1998, EL MAN TECHN S 23 IE, P323
[7]   Failure mechanism of brittle solder joint fracture in the presence of Electroless Nickel Immersion Gold (ENIG) interface [J].
Goyal, D ;
Lane, T ;
Kinzie, P ;
Panichas, C ;
Chong, KM ;
Villalobos, O .
52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS, 2002, :732-739
[8]   Solid state interfacial reaction of Sn-37Pb and Sn-3.5Ag solders with Ni-P under bump metallization [J].
He, M ;
Chen, Z ;
Qi, GJ .
ACTA MATERIALIA, 2004, 52 (07) :2047-2056
[9]  
JEON YD, 2002, MICROELECTRON RELIAB, V42, P1065
[10]  
JOHAL K, 2004, APEX DES SUMM TRAD S