Analysis of Transient Electric-Field Emitted by Atom-Probe Tomography Electrode

被引:0
|
作者
Xu, Z. [1 ]
Liu, Y. [1 ]
Ravelo, B. [1 ]
Maurice, O. [1 ]
Zhao, L. [2 ]
Vurpillot, F. [2 ]
机构
[1] Normandy Univ UNIROUEN, ESIGELEC, IRSEEM, F-76000 Rouen, France
[2] Univ Rouen, CNRS, GPM, UMR 6634, Av Univ, F-76801 St Etienne Du Rouvray, France
关键词
Atom probe tomography (APT); pulsed high voltage; electric field pulse; electrode EM characterization; radiated emission; transmission line; OPTIMIZATION;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An RF electromagnetic (EM) characterization of high pulsed voltage electrode is investigated in the present paper. The electrode acts as an electric- or E-field pulse generator for atom probe tomography (APT) application. The proposed electrode device is essentially comprised of a microstrip transmission line (TL) combined with via hole. The challenging prediction of the electrode signal integrity and E-field emission is elaborated. The APT pulse generator equivalent model is established. The transient response of the voltage pulse generator EM into transient electric pulse is analyzed. The excitation signal is assumed as a square wave pulse voltage with 1-kV amplitude and 2-ns full width time duration. The electrode device S-parameter responses from DC to 8-GHz is computed. The behavior of the transient E-field response in function of the position inside the substrate via hole is analysed. The delivered harmonic input current and power optimal values are assessed.
引用
收藏
页数:5
相关论文
共 50 条
  • [31] ATOM-PROBE FIELD-ION MICROSCOPE ANALYSIS OF SURFACES OF MATERIALS
    TSONG, TT
    CHEN, CL
    LIU, J
    JOURNAL OF MATERIALS RESEARCH, 1989, 4 (06) : 1549 - 1559
  • [32] EFFECT OF FIELD-EVAPORATION RATE ON QUANTITATIVE ATOM-PROBE ANALYSIS
    WAGNER, A
    SEIDMAN, DN
    JOURNAL DE PHYSIQUE, 1986, 47 (C-2): : 415 - 424
  • [33] Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography
    Xu Xin
    Liu Yuzi
    Wang Jie
    Isheim, Dieter
    Dravid, Vinayak P.
    Phatak, Charudatta
    Haile, Sossina M.
    NATURE MATERIALS, 2020, 19 (08) : 887 - +
  • [34] SURFACE MICROSCOPY AND ANALYSIS WITH ATOM-PROBE FIELD-ION MICROSCOPE
    TURNER, PJ
    REGAN, BJ
    SOUTHON, MJ
    VACUUM, 1972, 22 (10) : 443 - 446
  • [35] Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography
    Xin Xu
    Yuzi Liu
    Jie Wang
    Dieter Isheim
    Vinayak P. Dravid
    Charudatta Phatak
    Sossina M. Haile
    Nature Materials, 2020, 19 : 887 - 893
  • [36] ATOM-PROBE SPECTROSCOPY OF FIELD ADSORBED HE AND NE
    ERNST, N
    DRACHSEL, W
    LI, Y
    BOZDECH, G
    BLOCK, JH
    JOURNAL DE PHYSIQUE, 1986, 47 (C-7): : 7 - 9
  • [37] Perspective: From field-ion microscopy of single atoms to atom-probe tomography: A journey: "Atom-probe tomography" [Rev. Sci. Instrum. 78, 031101, (2007)]
    Seidman, David N.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03):
  • [38] ATOM-PROBE AND FIELD-ION MICROSCOPY OF SEMICONDUCTORS
    TSONG, TT
    HERMAN, M
    NG, YS
    ULTRAMICROSCOPY, 1979, 4 (03) : 384 - 385
  • [39] Three-dimensional atom-probe tomography: Advances and applications
    Seidman, David N.
    ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 : 127 - 158
  • [40] ADVANCES IN ATOM-PROBE FIELD-ION MICROSCOPY
    MULLER, EW
    JOURNAL OF MICROSCOPY-OXFORD, 1974, 100 (MAR): : 121 - 131