Defect assisted subwavelength resolution in III-V semiconductor photonic crystal flat lenses with n =-1

被引：10

作者：

Hofman, Maxence ^{[1
]}

Fabre, Nathalie ^{[1
]}

Melique, Xavier ^{[1
]}

Lippens, Didier ^{[1
]}

Vanbesien, Olivier ^{[1
]}

机构：

[1] Univ Sci & Tech Lille Flandres Artois, IEMN, CNRS, UMR 8520, F-59655 Villeneuve Dascq, France

来源：

OPTICS COMMUNICATIONS | 2010年 / 283卷 / 06期

关键词：

NEGATIVE REFRACTION; SUPERLENS;

D O I：

10.1016/j.optcom.2009.10.116

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose a III-V semiconductor photonic crystal slab designed to operate as a n = -1 superlens at lambda(0) = 1.55 mu m. The structure consists of air holes arranged in a two-dimensional triangular lattice, of period a, nanopatterned in an InP/InGaAsP/InP slab. Exploiting the second pass-band regime (a/lambda(0)similar to 0.31), subwavelength resolutions as low as 0.38 lambda(0) for planar lenses have been obtained by the insertion of hexagonal nanocavities within the crystal. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1169 / 1173

页数：5

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