Random selection of samples and features for getting general accuracy of classifier combination

被引:0
作者
Taniguchi, F [1 ]
Kudo, M [1 ]
机构
[1] Hokkaido Informat Univ, Fac Business Adm & Informat Sci, Ebetsu, Hokkaido 0698585, Japan
来源
6TH WORLD MULTICONFERENCE ON SYSTEMICS, CYBERNETICS AND INFORMATICS, VOL XVI, PROCEEDINGS: COMPUTER SCIENCE III | 2002年
关键词
pattern recognition; multiple classifier systems; subsampling; feature selection; boosting; bagging;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The goal of pattern classification is to classify class-unknown samples correctly, in which a classifier is trained from a finite number of samples. Multiple classifier si-stems are trials to overcome to a single (strong) classifier by combining some (weak) classifiers. In this paper, we propose a novel combining method in which each element classifier is constructed by a random selection of both training samples and features. Experimental results on two real datasets are shown. As a result, the performance of a single classifier was improved by combining them with this method.
引用
收藏
页码:329 / 332
页数:4
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