Proton beam dose-mapping via color centers in LiF thin-film detectors by fluorescence microscopy

被引:29
作者
Piccinini, Massimo [1 ]
Nichelatti, Enrico [2 ]
Ampollini, Alessandro [1 ]
Picardi, Luigi [1 ]
Ronsivalle, Concetta [1 ]
Bonfigli, Francesca [1 ]
Libera, Stefano [1 ]
Vincenti, Maria Aurora [1 ]
Montereali, Rosa Maria [1 ]
机构
[1] ENEA CR Frascati, Fus & Technol Nucl Safety & Secur, Via E Fermi 45, I-00044 Frascati, RM, Italy
[2] ENEA CR Casaccia, Fus & Technol Nucl Safety & Secur, Via Anguillarese 301, I-00123 Santa Maria Di Galeria, RM, Italy
关键词
F-AGGREGATE CENTERS; LITHIUM-FLUORIDE; POINT-DEFECTS; PHOTOLUMINESCENCE; CRYSTALS;
D O I
10.1209/0295-5075/117/37004
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
With the purpose of studying the behavior of novel solid-state lithium fluoride (LiF) films detectors based on the photoluminescence (PL) of radiation-induced defects for proton beam diagnostics and dosimetry, polycrystalline LiF thin films thermally evaporated on glass were irradiated at room temperature in a linear proton accelerator under development at ENEA. The irradiations were performed in air by proton beams of 3 and 7MeV energy, in a fluence range from 10(11) to 10(15) protons/cm(2). In the LiF films, proton irradiation induces the formation of F-2 and F-3(+) aggregate color centers, which simultaneously emit broad PL bands in the visible spectral range under excitation in the blue one. The integrated PL signal, acquired by a fluorescence microscope equipped with a s-CMOS camera, shows a linear dependence on the dose deposited in LiF films, extending from 10(3) to 10(6) Gy, independently of the proton energy. A simple theoretical model is put forward for the formation of color centers in LiF and is utilized to obtain a proton beam dose-map by processing the PL image stored in the LiF film detectors. Copyright (C) EPLA, 2017
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页数:5
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