Quantitative characterisation of chemical inhomogeneities in (Al)under-bar-Ag using high-resolution Z-ontrast STEM

被引:39
作者
Erni, R [1 ]
Heinrich, H [1 ]
Kostorz, G [1 ]
机构
[1] Swiss Fed Inst Technol, Inst Appl Phys, CH-8093 Zurich, Switzerland
关键词
quantitative transmission electron microscopy; Z-contrast STEM; HAADF STEM; multislice image simulation; GP zones; Al($)under-bar-Ag;
D O I
10.1016/S0304-3991(02)00249-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
The incoherent imaging model is applied to interpret high-resolution Z-contrast micrographs. A simple method for a column-by-column resolved characterisation, of Ag-rich precipitates in Al-Ag is developed.-No information on the detailed imaging process is required. Evaluating the high-angle scattering intensities of Al and Ag by image analysis, the number of Ag atoms contained in individual atomic columns can be determined accurately and moreover, the thickness of the thin foil can be calculated. Multislice simulations confirm the broad validity of the incoherent imaging model for Z-contrast STEM and are used to check the method presented. Finally, the image analysis is applied to experimental Z-contrast images of Guinier-Preston zones in Al-3 at% Ag. The Ag content of the individual atomic columns can be determined with an accuracy better than +/- 10%. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:125 / 133
页数:9
相关论文
共 17 条
[1]   FACETING OF GP ZONES IN AN AL-AG ALLOY [J].
ALEXANDERKB ;
LEGOUES, FK ;
AARONSON, HI ;
LAUGHLIN, DE .
ACTA METALLURGICA, 1984, 32 (12) :2241-2249
[2]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (10) :609-619
[3]   IMAGING PROPERTIES AND APPLICATIONS OF SLOW-SCAN CHARGE-COUPLED-DEVICE CAMERAS SUITABLE FOR ELECTRON-MICROSCOPY [J].
DERUIJTER, WJ .
MICRON, 1995, 26 (03) :247-275
[4]   SHAPE AND INTERNAL STRUCTURE OF GUINIER-PRESTON ZONES IN AL-AG [J].
DUBEY, PA ;
SCHONFELD, B ;
KOSTORZ, G .
ACTA METALLURGICA ET MATERIALIA, 1991, 39 (06) :1161-1170
[5]   DETECTOR GEOMETRY, THERMAL DIFFUSE-SCATTERING AND STRAIN EFFECTS IN ADF STEM IMAGING [J].
HILLYARD, S ;
SILCOX, J .
ULTRAMICROSCOPY, 1995, 58 (01) :6-17
[6]   Plasma cleaning and its applications for electron microscopy [J].
Isabell, TC ;
Fischione, PE ;
O'Keefe, C ;
Guruz, MU ;
Dravid, VP .
MICROSCOPY AND MICROANALYSIS, 1999, 5 (02) :126-135
[7]   Atomic-scale quantitative elemental analysis of boundary layers in a SrTiO3 ceramic condenser by high-angle annular dark-field electron microscopy [J].
Kawasaki, M ;
Yamazaki, T ;
Sato, S ;
Watanabe, K ;
Shiojiri, M .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2001, 81 (01) :245-260
[8]   SIMULATION OF ANNULAR DARK FIELD STEM IMAGES USING A MODIFIED MULTISLICE METHOD [J].
KIRKLAND, EJ ;
LOANE, RF ;
SILCOX, J .
ULTRAMICROSCOPY, 1987, 23 (01) :77-96
[9]   High-angle annular dark-field imaging of self-assembled Ge islands on Si(001) [J].
Liu, CP ;
Twesten, RD ;
Gibson, JM .
ULTRAMICROSCOPY, 2001, 87 (1-2) :79-88
[10]   THERMAL VIBRATIONS IN CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].
LOANE, RF ;
XU, PR ;
SILCOX, J .
ACTA CRYSTALLOGRAPHICA SECTION A, 1991, 47 :267-278