Quality-Relevant and Process-Relevant Fault Monitoring with Concurrent Projection to Latent Structures

被引:233
作者
Qin, S. Joe [1 ]
Zheng, Yingying [1 ]
机构
[1] Univ So Calif, Dept Chem Engn & Mat Sci, Los Angeles, CA 90089 USA
关键词
concurrent projection to latent structures; process monitoring; quality monitoring; output-relevant fault detection; input-relevant fault detection; PRINCIPAL COMPONENT ANALYSIS; PARTIAL LEAST-SQUARES; IDENTIFICATION; DIAGNOSIS; RECONSTRUCTION; SENSORS; PLS;
D O I
10.1002/aic.13959
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
A new concurrent projection to latent structures for the monitoring of output-relevant faults that affect the quality and input-relevant process faults is proposed. The input and output data spaces are concurrently projected to five subspaces, a joint input-output subspace that captures covariations between input and output, an output-principal subspace, an output-residual subspace, an input-principal subspace, and an input-residual subspace. Fault detection indices are developed based on the concurrent projection to latent structures (CPLS) partition of subspaces for various fault detection alarms. The proposed CPLS monitoring method offers complete monitoring of faults that happen in the predictable output subspace and the unpredictable output-residual subspace, as well as faults that affect the input spaces and could be incipient for the output. Numerical simulation examples and the Tennessee Eastman challenge problem are used to illustrate the effectiveness of the proposed methods. (C) 2012 American Institute of Chemical Engineers AIChE J, 59: 496-504, 2013
引用
收藏
页码:496 / 504
页数:9
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