High-Purity Copper Structures from a Perfluorinated Copper Carboxylate Using Focused Electron Beam Induced Deposition and Post-Purification

被引:11
作者
Berger, Luisa [1 ]
Jurczyk, Jakub [1 ,2 ]
Madajska, Katarzyna [3 ]
Edwards, Thomas Edward James [1 ]
Szymanska, Iwona [3 ]
Hoffmann, Patrik [1 ]
Utke, Ivo [1 ]
机构
[1] Swiss Fed Labs Mat Sci & Technol, Lab Mech Mat & Nanostruct Empa, CH-3602 Thun, Switzerland
[2] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland
[3] Nicolaus Copernicus Univ Torun, Fac Chem, PL-87100 Torun, Poland
基金
瑞士国家科学基金会; 欧盟地平线“2020”;
关键词
focused electron beam induced deposition; copper; low-volatility precursor; carboxylate; purification; Cu-2(pfp)(4); copper(II) pentafluoropropionate; CU-PRECURSORS; NANOSTRUCTURES; FABRICATION; PURE; TIPS;
D O I
10.1021/acsaelm.0c00282
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electron-induced modification of volatile physisorbed metal-organic molecules is the key process in focused electron beam induced deposition (FEBID). In this work, the perfluorinated copper carboxylate [Cu-2(mu-O2CC2F5)(4)], (Cu-2(pfp)(4)), was implemented in FEBID, as it has the highest metal-to-carbon ratio Cu/C = 1:6 compared to other Cu precursors used so far. FEBID was obtained within a small temperature window of 120-130 degrees C. Transmission electron microscopy verified the presence of metal(oxide) nanocrystals within a carbonaceous matrix. The chemical composition analysis revealed the loss of about 80% of ligand material during the electron-induced dissociation. The copper nanocrystals oxidized within a few minutes in films <80 nm upon exposure to ambient conditions, while they were protected by a carbon-fluorine-containing matrix in thicker areas of the deposits. A two-step post-growth annealing procedure with subsequent oxidizing and reducing atmosphere was used to purify the deposits. Pure copper crystals were formed in this step.
引用
收藏
页码:1989 / 1996
页数:8
相关论文
共 65 条
[1]   Electron-induced chemistry of surface-grown coordination polymers with different linker anions [J].
Ahlenhoff, Kai ;
Koch, Sascha ;
Emmrich, Daniel ;
Dalpke, Raphael ;
Goelzhaeuser, Armin ;
Swiderek, Petra .
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2019, 21 (05) :2351-2364
[2]   Electron Beam-Induced Surface Activation of Metal-Organic Framework HKUST-1: Unraveling the Underlying Chemistry [J].
Ahlenhoff, Kai ;
Preischl, Christian ;
Swiderek, Petra ;
Marbach, Hubertus .
JOURNAL OF PHYSICAL CHEMISTRY C, 2018, 122 (46) :26658-26670
[3]   Post-growth purification of Co nanostructures prepared by focused electron beam induced deposition [J].
Begun, E. ;
Dobrovolskiy, O. V. ;
Kompaniiets, M. ;
Sachser, R. ;
Gspan, Ch ;
Plank, H. ;
Huth, M. .
NANOTECHNOLOGY, 2015, 26 (07)
[4]   Rapid preparation of electron beam induced deposition Co magnetic force microscopy tips with 10 nm spatial resolution [J].
Belova, L. M. ;
Hellwig, Olav ;
Dobisz, Elizabeth ;
Dahlberg, E. Dan .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (09)
[5]   Gas-assisted silver deposition with a focused electron beam [J].
Berger, Luisa ;
Madajska, Katarzyna ;
Szymanska, Iwona B. ;
Hoflich, Katja ;
Polyakov, Mikhail N. ;
Jurczyk, Jakub ;
Guerra-Nunez, Carlos ;
Utke, Ivo .
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2018, 9 :224-232
[6]   1D Copper Nanostructures: Progress, Challenges and Opportunities [J].
Bhanushali, Sushrut ;
Ghosh, Prakash ;
Ganesh, Anuradda ;
Cheng, Wenlong .
SMALL, 2015, 11 (11) :1232-1252
[7]   Characterization of focused electron beam induced carbon deposits from organic precursors [J].
Bret, T ;
Mauron, S ;
Utke, I ;
Hoffmann, P .
MICROELECTRONIC ENGINEERING, 2005, 78-79 :300-306
[8]  
De Angelis F, 2010, NAT NANOTECHNOL, V5, P67, DOI [10.1038/nnano.2009.348, 10.1038/NNANO.2009.348]
[9]   Review of magnetic nanostructures grown by focused electron beam induced deposition (FEBID) [J].
De Teresa, J. M. ;
Fernandez-Pacheco, A. ;
Cordoba, R. ;
Serrano-Ramon, L. ;
Sangiao, S. ;
Ibarra, M. R. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 49 (24)
[10]   Three-Dimensional Electron Microscopy Simulation with the CASINO Monte Carlo Software [J].
Demers, Hendrix ;
Poirier-Demers, Nicolas ;
Couture, Alexandre Real ;
Joly, Dany ;
Guilmain, Marc ;
de Jonge, Niels ;
Drouin, Dominique .
SCANNING, 2011, 33 (03) :135-146