2017 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS)
|
2017年
关键词:
Gallium nitride;
high-electron-mobility transistor (HEMT);
power amplifiers;
Tri-gate;
W-band;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
First-ever realization of a W-band power amplifier (PA) millimeter-wave monolithic integrated circuit (MMIC) utilizing GaN-based Tri-gate high-electron-mobility transistors (HEMTs) is presented in this paper. Superior device-and circuit-level performances over conventional GaN HEMTs are proven to be empowered through implementation of the novel Tri-gate topology which exhibits a 3-dimensional gate profile. The measurements of the fabricated MMIC yield up to 30.6 dBm (1.15 W) of output power in the frequency range of 86-94 GHz with 8% of power-added-efficiency (PAE) and more than 12 dB of transducer power gain. The achieved results demonstrate the promising potential of Tri-gate GaN technology towards highperformance millimeter-wave PA designs.