High-Contrast Imaging with Keck Adaptive Optics and OSIRIS

被引：4

作者：

McElwain, Michael ^{[1
]}

Larkin, James ^{[2
]}

Metchev, Stanimir ^{[2
]}

Zuckerman, Benjamin ^{[2
]}

机构：

[1] Princeton Univ, Peyton Hall,Ivy Lane, Princeton, NJ 08540 USA

[2] UC Los Angeles, Los Angeles, CA 90095 USA

来源：

ADAPTIVE OPTICS SYSTEMS, PTS 1-3 | 2008年 / 7015卷

关键词：

integral field spectroscopy; high contrast imaging; speckle suppression; planet detection; adaptive optics; Keck; OSIRIS;

D O I：

10.1117/12.790201

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

While more than 200 extrasolar planets have been discovered using indirect techniques, the direct detection of this class of object has remained at the sensitivity limits of ground based observatories. The development of improved adaptive optics systems and high contrast instruments has increased the sensitivity to extrasolar planets. We present high contrast results from the OSIRIS infrared lenslet-based integral field spectrograph (IFS) operating behind the Keck II adaptive optics (AO) system. OSIRIS spatially samples the Keck PSF at the diffraction limit, while providing a spectral resolution of 3800 for each spaxel. The OSIRIS integral field sampling simultaneously monitors the PSF over a broad band (20%), and this sampling is used to identify and suppress speckle diffraction features. The high-contrast sensitivity of Keck II AO near-infrared IFS (OSIRIS) and near-infrared imager (NIRC2) are compared.

引用

页数：12

共 41 条

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