Josephson tunnel junctions with a strong ferromagnetic interlayer

被引:89
作者
Bannykh, A. A. [1 ,2 ,3 ]
Pfeiffer, J. [4 ,5 ]
Stolyarov, V. S. [3 ]
Batov, I. E. [3 ]
Ryazanov, V. V. [3 ]
Weides, M. [1 ,2 ]
机构
[1] Inst Solid State, D-52425 Julich, Germany
[2] Forschungszentrum Julich, JARA Fundamentals Future Informat Technol, D-52425 Julich, Germany
[3] Russian Acad Sci, Inst Solid State Phys, Chernogolovka 142432, Russia
[4] Univ Tubingen, Phys Inst Expt Phys 2, D-72076 Tubingen, Germany
[5] Univ Tubingen, Ctr Collect Quantum Phenomena, D-72076 Tubingen, Germany
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 05期
关键词
FABRICATION; SURFACE;
D O I
10.1103/PhysRevB.79.054501
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The dependence of the critical current density j(c) on the ferromagnetic interlayer thickness d(F) was determined for Nb/Al(2)O(3)/Cu/Ni/Nb Josephson tunnel junctions with ferromagnetic Ni interlayer thicknesses from very thin films (similar to 1 nm) upward and classified into F-layer thickness regimes showing a dead magnetic layer, exchange, exchange + anisotropy and total suppression of j(c). The Josephson coupling changes from 0 to pi as function of d(F), and-very close to the crossover thickness-as function of temperature. The strong suppression of the supercurrent in comparison to nonmagnetic Nb/Al(2)O(3)/Cu/Nb junctions indicated that the insertion of a F layer leads to additional interface scattering. The transport inside the dead magnetic layer was in dirty limit. For the magnetically active regime fitting with both the clean and the dirty limit theories was carried out, indicating dirty limit condition, too. The results were discussed in the framework of literature.
引用
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页数:7
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