A 60-GHz Dual-Mode Class AB Power Amplifier in 40-nm CMOS

被引:202
作者
Zhao, Dixian [1 ]
Reynaert, Patrick [1 ]
机构
[1] Univ Louvain, Dept Elect Engn Microelect & Sensors ESAT MICAS, B-3001 Louvain, Belgium
基金
欧洲研究理事会;
关键词
Power amplifier; CMOS; 60; GHz; millimeter-wave; device parasitics; transformer; power combining; load pull; impedance matching; Class AB; power-added efficiency (PAE); linearity; two-tone test; AM-PM distortion; reliability; hot carrier injection; GHZ; TRANSFORMER; PAE;
D O I
10.1109/JSSC.2013.2275662
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 60-GHz dual-mode power amplifier (PA) is implemented in 40-nm bulk CMOS technology. To boost the amplifier performance at millimeter-wave (mm Wave) frequencies, a new transistor layout is proposed to minimize the device and interconnect parasitics while the neutralized amplifier stage is co-optimized with input transformer to improve the power gain and stability. The transformer-based power-combining PA consists of two unit amplifiers, operating in Class AB for better back-off efficiency. To further reduce the power consumption and hence extend battery lifetime, one unit PA is tuned off in low-power mode. A switch is used to short the output of this non-operating unit PA to reduce the combiner loss and improve the efficiency. The PA achieves a measured saturated output power (P-SAT) of 17.0 dBm (12.1 dBm) and 1-dB compressed power (P-1dB) of 13.8 dBm (9.1 dBm) in the high-power (low-power) mode. The power-added efficiencies (PAEs) at P-SAT and P-1dB are 30.3% and 21.6% respectively for the high-power mode. Compared to Class A, the PA operating in Class AB shows 5.3% improvement in measured PAE at P-1dB with no compromise in linearity. The PA with the power combiner only occupies an active area of 0.074 mm(2). The reliability measurements are also conducted and the PA has an estimated lifetime of 80613 hours.
引用
收藏
页码:2323 / 2337
页数:15
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