Development of an integrated apparatus of micro-EDM and micro-CMM

被引:4
作者
Goda, Jun [1 ,2 ]
Mitsui, Kimiyuki
机构
[1] Keio Univ, Sch Integrated Design Engn, Kohoku Ku, Yokohama, Kanagawa 2238522, Japan
[2] Keio Univ, Dept Mech Engn, Mitsui Lab, Kohoku Ku, Yokohama, Kanagawa 2238522, Japan
关键词
Micro-EDM; Micro-CMM; Electric discharge scanning; Shape general functions; Micro-hole; Probe; Micro-parts;
D O I
10.1016/j.measurement.2012.08.014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Authors have developed a 4-axis micro-CMM that has miniaturized probe. By using an L-shaped probe, the micro-CMM can measure three dimensional coordinates of the high aspect ratio structures such as micro-holes. However, an installation error of the probe primarily affects the accuracy in the micro-CMM because the probe was previously machined in other micro-EDMs. In this research, we developed an integrated apparatus of micro-EDM and micro-CMM. The micro-EDM has 5-axis control with a general plate tool electrode and it can make probes of various shapes by the electric discharge scanning method. And the 4-axis micro-CMM has a mechanism that rotates the probe and it can measure with sub-micrometer accuracy. In this paper, Authors introduce a basic configuration of the integrated apparatus, machining method of the probe, and measuring method and measurement result of the micro-hole. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:552 / 562
页数:11
相关论文
共 10 条
[1]   Study of vibration-assisted micro-EDM - The effect of vibration on machining time and stability of discharge [J].
Endo, Takashi ;
Tsujimoto, Takayuki ;
Mitsui, Kimiyuki .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2008, 32 (04) :269-277
[2]  
Goda J., 2011, EUSP 2011 P, V1, P80
[3]  
Leach RK, 2010, FUNDAMENTAL PRINCIPLES OF ENGINEERING NANOMETROLOGY, P1
[4]  
PEINER E, 2008, SENSORS FOCUS TACTIL, P377
[5]  
Reshetov D. N., 1998, ACCURACY MACHINE TOO
[6]  
Sheu D.Y., 2010, P ISMQC 2010, pE4
[7]   Development of measurement method for shape and dimension of micro-components - (Modification of the original measuring system, calibration of the probes and the results of dimensional measurements) [J].
Shiramatsu, T ;
Kitano, K ;
Kawada, M ;
Mitsui, K .
JSME INTERNATIONAL JOURNAL SERIES C-MECHANICAL SYSTEMS MACHINE ELEMENTS AND MANUFACTURING, 2004, 47 (01) :369-376
[8]  
Takaya Y., 1999, Measurement, V25, P9, DOI 10.1016/S0263-2241(98)00062-1
[9]  
Von Seggelen JK, 2005, CIRP ANN-MANUF TECHN, V54, P487
[10]  
Yamamoto M, 1996, INT J JPN S PREC ENG, V30, P49