Direct current bias effects on grain boundary Schottky barriers in CaCu3Ti4O12 - art. no. 072902

被引:63
作者
Kim, ID
Rothschild, A
Tuller, HL
机构
[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[2] Korea Inst Sci & Technol, Optoelect Mat Res Ctr, Seoul 130650, South Korea
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2172739
中图分类号
O59 [应用物理学];
学科分类号
摘要
CaCu3Ti4O12 exhibits an unusually high dielectric constant on the order of 10(5) and highly nonlinear I-V characteristics. Impedance spectroscopy measurements carried out in this work point to the crucial role played by grain boundary barriers in controlling the electrical properties of this material. Under dc bias, the grain boundary resistance decreases, followed by a precipitous breakdown at higher applied voltages. The barrier height is estimated to be similar to 0.82 eV. The grain conductivity shows a transition from a negative temperature coefficient of resistance with activation energy of similar to 0.08 eV to a positive temperature coefficient of resistance at 280 degrees C suggesting a transition from impurity ionization to scattering controlled mobility in the carrier saturation region.
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页数:3
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