Investigation of ZnO/Al/ZnO multilayers as transparent conducting coatings

被引：31

作者：

Al-Kuhaili, M. F. ^{[1
]}

Al-Maghrabi, M. A. ^{[1
]}

Durrani, S. M. A. ^{[1
]}

Bakhtiari, I. A. ^{[1
]}

机构：

[1] King Fahd Univ Petr & Minerals, Dept Phys, Dhahran 31261, Saudi Arabia

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2008年 / 41卷 / 21期

关键词：

D O I：

10.1088/0022-3727/41/21/215302

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Multilayer ZnO/Al/ZnO coatings were deposited by thermal evaporation on unheated substrates. Subsequently, the coatings were annealed in air in the temperature range 300-600 degrees C. The structural properties of the films were investigated using x-ray diffraction and atomic force microscopy. The chemical properties were determined from x-ray photoelectron spectroscopy along with elemental depth profiling. The electrical and optical properties of the coatings were studied in order to evaluate their performance as transparent conducting coatings. The best performance was obtained with films annealed at 300 degrees C, for which the average visible transmittance was 75% and the resistivity was 2.9 x 10(-3) Omega cm.

引用

页数：8

共 30 条

[1] Synthesis and characterization of ZnO thin film grown by electron beam evaporation [J].

Agarwal, D. C. ;

Chauhan, R. S. ;

Kumar, Amit ;

Kabiraj, D. ;

Singh, F. ;

Khan, S. A. ;

Avasthi, D. K. ;

Pivin, J. C. ;

Kumar, M. ;

Ghatak, J. ;

Satyam, P. V. .

JOURNAL OF APPLIED PHYSICS, 2006, 99 (12)

[2]

[Anonymous], SOL ENERGY MAT SOL C

[3] Influence of annealing temperature on the properties of ZnO thin films deposited by thermal evaporation [J].

Bouhssira, N. ;

Abed, S. ;

Tomasella, E. ;

Cellier, J. ;

Mosbah, A. ;

Aida, M. S. ;

Jacquet, M. .

APPLIED SURFACE SCIENCE, 2006, 252 (15) :5594-5597

[4] Preparation and characterization of Al and Mn doped ZnO (ZnO: (Al, Mn)) transparent conducting oxide films [J].

Cao, HT ;

Pei, ZL ;

Gong, J ;

Sun, C ;

Huang, RF ;

Wen, LS .

JOURNAL OF SOLID STATE CHEMISTRY, 2004, 177 (4-5) :1480-1487

[5] X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films [J].

Chen, M ;

Wang, X ;

Yu, YH ;

Pei, ZL ;

Bai, XD ;

Sun, C ;

Huang, RF ;

Wen, LS .

APPLIED SURFACE SCIENCE, 2000, 158 (1-2) :134-140

[6] Properties of ZnO:Al films on polyester produced by de magnetron reactive sputtering [J].

Chen, M ;

Pei, ZL ;

Wang, X ;

Sun, C ;

Wen, LS .

MATERIALS LETTERS, 2001, 48 (3-4) :137-143

[7] Fabrication and characterization of transparent conductive ZnO:Al thin films prepared by direct current magnetron sputtering with highly conductive ZnO(ZnAl2O4) ceramic target [J].

Fang, GJ ;

Li, DJ ;

Yao, BL .

JOURNAL OF CRYSTAL GROWTH, 2003, 247 (3-4) :393-400

[8] Influence of post-annealing treatment on the structure properties of ZnO films [J].

Fang, ZB ;

Yan, ZJ ;

Tan, YS ;

Liu, XQ ;

Wang, YY .

APPLIED SURFACE SCIENCE, 2005, 241 (3-4) :303-308

[9] Properties of transparent conductive ZnO:Al thin films prepared by magnetron sputtering [J].

Fu, EG ;

Zhuang, DM ;

Zhang, G ;

Ming, Z ;

Yang, WF ;

Liu, JJ .

MICROELECTRONICS JOURNAL, 2004, 35 (04) :383-387

[10] Transparent conductors as solar energy materials: A panoramic review [J].

Granqvist, Claes G. .

SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2007, 91 (17) :1529-1598

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