Crystal structure: How to use data quality Indicators to select a high resolution cutoff

被引：0

作者：

Ait Mouha, M. ^{[1
]}

Tlamsamani, D. ^{[1
]}

Yamni, K. ^{[1
]}

机构：

[1] Moulay Ismail Univ, Fac Sci, Dept Chem, EMaMePS, Meknes, Morocco

来源：

INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS, MICROSCOPY AND ENERGY (ICAMME) 2019 | 2020年 / 783卷

关键词：

D O I：

10.1088/1757-899X/783/1/012005

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

To get a good quality crystal structure, we should first do the initial analysis of the diffraction data. There are many global indicators of the quality of the diffraction data. Accentuated in this paper are the d(min), d(eff),C, R-merge and R-r.i.m. Based on the results obtained, this paper will overview in our understanding of how to use these indicators to select a high resolution cutoff that leads to the best crystal structure, using practical examples.

引用

页数：6

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