Thin chalcogenide films prepared by pulsed laser deposition - new amorphous materials applicable in optoelectronics and chemical sensors

被引:129
作者
Frumar, M.
Frumarova, B.
Nemec, P.
Wagner, T.
Jedelsky, J.
Hrdlicka, M.
机构
[1] Univ Pardubice, Res Ctr, Pardubice 53210, Czech Republic
[2] Univ Pardubice, Dept Gen & Inorgan Chem, Pardubice 53210, Czech Republic
[3] Univ Pardubice, Joint Lab Solid State Chem, Acad Sci Czech Republ, Inst Macromol Chem, Pardubice 53210, Czech Republic
基金
美国国家科学基金会;
关键词
amorphous semiconductors; sensors; laser deposition; chalcogenides; laser-matter interactions; defects; luminescence; non-linear optics; photoinduced effects; rare-earths in glasses; short-range order;
D O I
10.1016/j.jnoncrysol.2005.11.043
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Principles, advantages, applications and drawbacks of pulsed laser deposition (PLD) technique for thin films preparation are reviewed. The PLD method is promising for preparation of thin films of complex composition, including rare-earth and Ag-doped chalcogenide films; all components of the target can be evaporated at once. Low volatility and refractory materials can be also deposited. The deposition in vacuum, inert or reactive atmosphere is possible. Results obtained in a study of chalcogenide films are discussed and the current state-of-the-art is reviewed. The composition and structure of PLD films can be different from thermally evaporated films and new materials or materials with new properties applicable in optics and optoelectronics can be prepared. The method can be used for fabrication of different chalcogenide-based sensors and memory materials of complex composition. Photoinduced changes of structure and properties of PLD films and chalcogenides exposed to intense laser pulses are also discussed. The intense laser pulses can change the properties of the materials prepared and can be used for fabrication of chalcogenide-based waveguides, diffractive elements and high-density optical data storage media. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:544 / 561
页数:18
相关论文
共 128 条
[61]   Structure of As-Se and As-P-Se glasses studied by Raman spectroscopy [J].
Kovanda, V ;
Vlcek, M ;
Jain, H .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2003, 326 :88-92
[62]   Granulated metal nanostructure deposited by laser ablation accompanied by cascade drop fission [J].
Kozhevin, VM ;
Yavsin, DA ;
Kouznetsov, VM ;
Busov, VM ;
Mikushkin, VM ;
Nikonov, SY ;
Gurevich, SA ;
Kolobov, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (03) :1402-1405
[63]  
LANCOK J, 1999, SUPERFICIES VACIO, V9, P316
[64]   Study of plasma expansion induced by femtosecond pulsed laser ablation and deposition of diamond-like carbon films [J].
Loir, AS ;
Garrelie, F ;
Subtil, JL ;
Goutaland, F ;
Belin, M ;
Le Harzic, R ;
Donnet, C ;
Ouerdane, Y ;
Rogemond, F ;
Laporte, P .
APPLIED SURFACE SCIENCE, 2003, 208 :553-560
[65]   Silicon and zinc telluride nanoparticles synthesized by low energy density pulsed laser ablation into ambient gases [J].
Lowndes, DH ;
Rouleau, CM ;
Thundat, TG ;
Duscher, G ;
Kenik, EA ;
Pennycook, SJ .
JOURNAL OF MATERIALS RESEARCH, 1999, 14 (02) :359-370
[66]  
Luk'yanchuk B., 2002, LASER CLEANING OPTIC
[67]   Pulsed laser deposition of active waveguides [J].
Martino, M ;
Caricato, AP ;
Fernández, M ;
Leggieri, G ;
Jha, A ;
Ferrari, M ;
Mattarelli, M .
THIN SOLID FILMS, 2003, 433 (1-2) :39-44
[68]  
MILLER JC, 1998, EXPT METHODS PHYS SC, V30
[69]   Fabrication of a micro-scale, indium-tin-oxide thin film strain-sensor by pulsed laser deposition and focused ion beam machining [J].
Miller, TM ;
Fang, H ;
Magruder, RH ;
Weller, RA .
SENSORS AND ACTUATORS A-PHYSICAL, 2003, 104 (02) :162-170
[70]   RAMAN-SCATTERING IN AMORPHOUS AS-SE SYSTEM [J].
MORI, T ;
ONARI, S ;
ARAI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) :1027-1031