Self-Aligned Nanotube-Nanowire Phase Change Memory

被引:119
作者
Xiong, Feng [1 ,2 ]
Bae, Myung-Ho [1 ,2 ]
Dai, Yuan [1 ,2 ]
Liao, Albert D. [1 ,2 ]
Behnam, Ashkan [1 ,2 ]
Carrion, Enrique A. [1 ,2 ]
Hong, Sungduk [1 ,2 ]
Ielmini, Daniele [3 ]
Pop, Eric [1 ,2 ]
机构
[1] Univ Illinois, Micro & Nanotechnol Lab, Urbana, IL 61801 USA
[2] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
[3] Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy
基金
美国国家科学基金会;
关键词
Phase change memory; nanowire; self-aligned; carbon nanotube; interconnects; LOGIC OPERATIONS; CARBON NANOTUBES;
D O I
10.1021/nl3038097
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A central issue of nanoelectronics concerns their fundamental scaling limits, that is, the smallest and most energy-efficient devices that can function reliably. Unlike charge-based electronics that are prone to leakage at nanoscale dimensions, memory devices based on phase change materials (PCMs) are more scalable, storing digital information as the crystalline or amorphous state of a material. Here, we describe a novel approach to self-align PCM nanowires with individual carbon nanotube (CNT) electrodes for the first time. The highly scaled and spatially confined memory devices approach the ultimate scaling limits of PCM technology, achieving ultralow programming currents (similar to 0.1 mu A set, similar to 1.6 mu A reset), outstanding on/off ratios (similar to 10(3)), and improved endurance and stability at few-nanometer bit dimensions. In addition, the powerful yet simple nanofabrication approach described here can enable confining and probing many other nanoscale and molecular devices self-aligned with CNT electrodes.
引用
收藏
页码:464 / 469
页数:6
相关论文
共 33 条
[1]   Effects of tip-nanotube interactions on atomic force microscopy imaging of carbon nanotubes [J].
Alizadegan, Rouholla ;
Liao, Albert D. ;
Xiong, Feng ;
Pop, Eric ;
Hsia, K. Jimmy .
NANO RESEARCH, 2012, 5 (04) :235-247
[2]   Local characterization and transformation of phase-change media by scanning thermal probes [J].
Bichet, O ;
Wright, CD ;
Samson, Y ;
Gidon, S .
JOURNAL OF APPLIED PHYSICS, 2004, 95 (05) :2360-2364
[3]   Physical origin of the resistance drift exponent in amorphous phase change materials [J].
Boniardi, Mattia ;
Ielmini, Daniele .
APPLIED PHYSICS LETTERS, 2011, 98 (24)
[4]   'Memristive' switches enable 'stateful' logic operations via material implication [J].
Borghetti, Julien ;
Snider, Gregory S. ;
Kuekes, Philip J. ;
Yang, J. Joshua ;
Stewart, Duncan R. ;
Williams, R. Stanley .
NATURE, 2010, 464 (7290) :873-876
[5]   Phase change memory technology [J].
Burr, Geoffrey W. ;
Breitwisch, Matthew J. ;
Franceschini, Michele ;
Garetto, Davide ;
Gopalakrishnan, Kailash ;
Jackson, Bryan ;
Kurdi, Buelent ;
Lam, Chung ;
Lastras, Luis A. ;
Padilla, Alvaro ;
Rajendran, Bipin ;
Raoux, Simone ;
Shenoy, Rohit S. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 28 (02) :223-262
[6]   Low resistance, high dynamic range reconfigurable phase change switch for radio frequency applications [J].
Chua, E. K. ;
Shi, L. P. ;
Zhao, R. ;
Lim, K. G. ;
Chong, T. C. ;
Schlesinger, T. E. ;
Bain, J. A. .
APPLIED PHYSICS LETTERS, 2010, 97 (18)
[7]   Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization [J].
Estrada, David ;
Dutta, Sumit ;
Liao, Albert ;
Pop, Eric .
NANOTECHNOLOGY, 2010, 21 (08)
[8]   Covalently bridging gaps in single-walled carbon nanotubes with conducting molecules [J].
Guo, XF ;
Small, JP ;
Klare, JE ;
Wang, YL ;
Purewal, MS ;
Tam, IW ;
Hong, BH ;
Caldwell, R ;
Huang, LM ;
O'Brien, S ;
Yan, JM ;
Breslow, R ;
Wind, SJ ;
Hone, J ;
Kim, P ;
Nuckolls, C .
SCIENCE, 2006, 311 (5759) :356-359
[9]   Threshold switching mechanism by high-field energy gain in the hopping transport of chalcogenide glasses [J].
Ielmini, Daniele .
PHYSICAL REVIEW B, 2008, 78 (03)
[10]   Localized Temperature and Chemical Reaction Control in Nanoscale Space by Nanowire Array [J].
Jin, C. Yan ;
Li, Zhiyong ;
Williams, R. Stanley ;
Lee, K-Cheol ;
Park, Inkyu .
NANO LETTERS, 2011, 11 (11) :4818-4825