Facile growth of SnS and SnS 0.40 Se 0.60 thin films as an absorber layer in the solar cell structure

被引:11
作者
Banotra, Arun [1 ,2 ]
Padha, Naresh [1 ]
机构
[1] Univ Jammu, Dept Phys, Jammu 180006, India
[2] Cluster Univ Jammu, Sch Sci, Jammu 180001, India
关键词
OPTICAL-PROPERTIES; PHOTOVOLTAIC PROPERTIES; ELECTRICAL-PROPERTIES; TIN; TEMPERATURE;
D O I
10.1016/j.matpr.2019.11.154
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:3420 / 3425
页数:6
相关论文
共 40 条
[1]   INVESTIGATIONS ON SNS [J].
ALBERS, W ;
VINK, HJ ;
HAAS, C ;
WASSCHER, JD .
JOURNAL OF APPLIED PHYSICS, 1961, 32 :2220-&
[2]   Effect of annealing on physical characteristics of the vacuum evaporated mixed phase SnxSy thin films [J].
Banotra, A. ;
Padha, N. .
MATERIALS RESEARCH EXPRESS, 2017, 4 (11)
[3]   Effect of substrate temperature on structural, optical and electrical properties of pulsed laser ablated nanostructured indium oxide films [J].
Beena, D. ;
Lethy, K. J. ;
Vinodkumar, R. ;
Pillai, V. P. Mahadevan ;
Ganesan, V. ;
Phase, D. M. ;
Sudheer, S. K. .
APPLIED SURFACE SCIENCE, 2009, 255 (20) :8334-8342
[4]   The electronic consequences of multivalent elements in inorganic solar absorbers: Multivalency of Sn in Cu2ZnSnS4 [J].
Biswas, Koushik ;
Lany, Stephan ;
Zunger, Alex .
APPLIED PHYSICS LETTERS, 2010, 96 (20)
[5]   THIN-FILM CDS/CDTE SOLAR-CELL WITH 15.8-PERCENT EFFICIENCY [J].
BRITT, J ;
FEREKIDES, C .
APPLIED PHYSICS LETTERS, 1993, 62 (22) :2851-2852
[6]  
Cullity B. D., ELEMENTS XRAY DIFFRA
[7]   Optical properties of Ag-TiO2 nanocermet films prepared by cosputtering and multilayer deposition techniques [J].
Dakka, A ;
Lafait, J ;
Sella, C ;
Berthier, S ;
Abd-Lefdil, M ;
Martin, JC ;
Maaza, M .
APPLIED OPTICS, 2000, 39 (16) :2745-2753
[8]  
Dutta PK, 2018, MATER TODAY-PROC, V5, P23321
[9]  
Feng KC, 2012, CHINESE J PHYS, V50, P932, DOI 10.6122/CJP.50.932
[10]   SnS thin-films by RF sputtering at room temperature [J].
Hartman, Katy ;
Johnson, J. L. ;
Bertoni, Mariana I. ;
Recht, Daniel ;
Aziz, Michael J. ;
Scarpulla, Michael A. ;
Buonassisi, Tonio .
THIN SOLID FILMS, 2011, 519 (21) :7421-7424