Transmission electron microscopy investigation of Bi-based HTS tapes.

被引：13

作者：

Eastell, CJ ^{[1
]}

Henry, BM ^{[1
]}

Morgan, CG ^{[1
]}

Grovenor, CRM ^{[1
]}

Goringe, MJ ^{[1
]}

Burgoyne, JW ^{[1
]}

DewHughes, D ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT ENGN SCI,OXFORD OX1 3PJ,ENGLAND

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期

关键词：

D O I：

10.1109/77.621001

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features, Such features include variation in grain boundary structure, amorphous phases at twist grain boundaries, residual 2212 layers present at grain boundaries and inside grains, and secondary phases, The Ag/superconductor interface has been shown to be relatively planar with no amorphous phases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface.

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页码：2083 / 2086

页数：4

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