An impressive structure containing triple trenches for RF power performance (TT-SOI-MESFET)

被引:23
作者
Anvarifard, Mohammad K. [1 ]
机构
[1] Univ Guilan, Fac Engn & Technol, Dept Engn Sci, Rudsar Vajargah, Iran
关键词
RF power; Triple trenches; TT-SOI-MESFET; FIELD-EFFECT TRANSISTOR; BREAKDOWN-VOLTAGE; BURIED-OXIDE; LDMOSFET; REGION; IMPROVEMENT; DENSITY;
D O I
10.1007/s10825-017-1078-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The radio-frequency (RF) power characteristics of a silicon-on-insulator metal-semiconductor field-effect transistor (SOI-MESFET) were improved with effective optimization of the simple structure. Separate triple trenches were introduced in the proposed device to improve the electrical performance. The SOI-MESFET with separate triple trenches (TT-SOI-MESFET) benefits from these trenches for dispersion of the potential lines, leading to enhanced RF power features. A comparison of the proposed structure with the simple SOI-MESFET structure revealed that the TT-SOI-MESFET exhibited improved RF power characteristics in terms of breakdown voltage, drain-source conductance, gate-source capacitance, total gate capacitance, maximum output power density, minimum noise figure and global lattice temperature.
引用
收藏
页码:230 / 237
页数:8
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