Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

被引：8

作者：

Consoli, Antonio ^{[1
]}

Bonilla, Borja ^{[1
]}

Tijero, Jose Manuel G. ^{[1
]}

Esquivias, Ignacio ^{[1
]}

机构：

[1] Univ Politecn Madrid, Dept Tecnol Foton, ETSI Telecomunicac, E-28040 Madrid, Spain

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 05期

关键词：

SURFACE-EMITTING LASER; BROADENING FACTOR; INJECTION-LASERS; CHIRP PARAMETER; DIFFERENTIATION; PULSES; ALPHA;

D O I：

10.1364/OE.20.004979

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new method for measuring the linewidth enhancement factor (alpha-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The alpha-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the alpha-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than +/- 8%. (C) 2012 Optical Society of America

引用

页码：4979 / 4987

页数：9

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