Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

被引：8

作者：

Consoli, Antonio ^{[1
]}

Bonilla, Borja ^{[1
]}

Tijero, Jose Manuel G. ^{[1
]}

Esquivias, Ignacio ^{[1
]}

机构：

[1] Univ Politecn Madrid, Dept Tecnol Foton, ETSI Telecomunicac, E-28040 Madrid, Spain

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 05期

关键词：

SURFACE-EMITTING LASER; BROADENING FACTOR; INJECTION-LASERS; CHIRP PARAMETER; DIFFERENTIATION; PULSES; ALPHA;

D O I：

10.1364/OE.20.004979

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new method for measuring the linewidth enhancement factor (alpha-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The alpha-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the alpha-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than +/- 8%. (C) 2012 Optical Society of America

引用

页码：4979 / 4987

页数：9

共 20 条

[1]

Coldren L. A., 1995, DIODE LASERS PHOTONI

[2] Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator [J].

Consoli, Antonio ;

Tijero, Jose Manuel G. ;

Esquivias, Ignacio .

OPTICS EXPRESS, 2011, 19 (11) :10805-10812

[3] Characterization of Gain-Switched Pulses From 1.55-μm VCSEL [J].

Consoli, Antonio ;

Esquivias, I. ;

Lopez Hernandez, F. J. ;

Mulet, J. ;

Balle, Salvador .

IEEE PHOTONICS TECHNOLOGY LETTERS, 2010, 22 (11) :772-774

[4] SIMPLE MEASUREMENT OF FIBER DISPERSION AND OF CHIRP PARAMETER OF INTENSITY-MODULATED LIGHT EMITTER [J].

DEVAUX, F ;

SOREL, Y ;

KERDILES, JF .

JOURNAL OF LIGHTWAVE TECHNOLOGY, 1993, 11 (12) :1937-1940

[5] Noise correlation, regenerative amplification, and the linewidth enhancement factor of a vertical-cavity surface-emitting laser [J].

Fordell, Thomas ;

Lindberg, Asa Marie .

IEEE PHOTONICS TECHNOLOGY LETTERS, 2008, 20 (9-12) :667-669

[6] Experiments on the linewidth-enhancement factor of a vertical-cavity surface-emitting laser [J].

Fordell, Thomas ;

Lindberg, Asa Marie .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 2007, 43 (01) :6-15

[7] MEASUREMENT OF THE LINEWIDTH ENHANCEMENT FACTOR-ALPHA OF SEMICONDUCTOR-LASERS [J].

HARDER, C ;

VAHALA, K ;

YARIV, A .

APPLIED PHYSICS LETTERS, 1983, 42 (04) :328-330

[8] MEASUREMENTS OF THE SEMICONDUCTOR-LASER LINEWIDTH BROADENING FACTOR [J].

HENNING, ID ;

COLLINS, JV .

ELECTRONICS LETTERS, 1983, 19 (22) :927-929

[9] THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS [J].

HENRY, CH .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1982, 18 (02) :259-264

[10] NOVEL MEASUREMENT TECHNIQUE OF ALPHA-FACTOR IN DFB SEMICONDUCTOR-LASERS BY INJECTION LOCKING [J].

HUI, R ;

MECOZZI, A ;

DOTTAVI, A ;

SPANO, P .

ELECTRONICS LETTERS, 1990, 26 (14) :997-998

← 1 2 →