Study on Surface Modification of Indium Tin Oxide and Resist Surfaces Using CF4/O2 Plasma for Manufacturing Organic Light-Emitting Diodes by Inkjet Printing

被引:0
作者
Ikagawa, Masakuni [1 ,3 ]
Tohno, Ichiro [1 ]
Shinmura, Tadashi [1 ]
Takagi, Shigeyuki [1 ]
Kataoka, Yoshinori [2 ]
Fujihira, Masamichi [3 ]
机构
[1] Toshiba Co Ltd, Corp Mfg Engn Ctr, Isogo Ku, Yokohama, Kanagawa 2350017, Japan
[2] SED Inc, Kanagawa 2540013, Japan
[3] Tokyo Inst Technol, Dept Biomol Engn, Midori Ku, Yokohama, Kanagawa 2268501, Japan
关键词
organic light-emitting diodes; indium tin oxide; plasma modification; hydrophobic; hydrophilic; inkjet printing;
D O I
10.1143/JJAP.47.8935
中图分类号
O59 [应用物理学];
学科分类号
摘要
We Studied a surface modification technique for indium tin oxide (ITO) anodes without precleaning and resist banks for Manufacturing organic light-emitting diodes (OLEDs) by inkjet printing. The ITO surface modified by inductively Coupled plasma (ICP) with all optimized CF4/O-2 (7 : 3) gas mixture improved both its hydrophilicity and its work function, while the resist Surface treated by the plasma became hydrophobic. The resist and ITO surfaces treated by plasmas of various gas mixtures (i.e., CF4, CF4/Ar (1 : 2), CF4/O-2 (x : 1; x = 1, 7/3, 4, and 9) were analyzed by X-ray photoelectron spectroscopy (XPS) of the C 1s, F Is, O 1s, and In 3d(5/2) Core levels. Oil the uncleaned ITO Surfaces modified by CF4/O-2 plasmas, organic contaminants were removed more efficiently and the deposition of CFx, on the remaining contaminants decreased with increasing oxygen. The amount. of F in the form of InFx., increased using the CF4/O-2 (7 : 3) plasma in comparison with that using the CF4/Ar and CF4 plasmas. We investigated the, effect of adding oxygen to CF4 oil the change in gaseous species produced in the plasma chamber by mass spectrometry. In the CF4/O-2 (7 : 3) plasma, the peak intensities of F+, HF+, F2+, O+, and O-2(+) were higher than those in the CF4 plasma. The results Suggest that 111203 was generated by the oxidation of indium with O, and InFx, was generated by the fluoridation of indium with HF. By introducing InFx, onto ITO surfaces using the CF4/O-2 plasma, the hole-injection energy barrier could be reduced. [DOI: 10.1143/JJAP.47.8935]
引用
收藏
页码:8935 / 8942
页数:8
相关论文
共 35 条
[1]   Plasma treatments of indium tin oxide anodes in carbon tetrafluorinde (CF4)/oxygen (O2) to improve the performance of organic light-emitting diodes [J].
Chan, IM ;
Hong, FCN .
THIN SOLID FILMS, 2003, 444 (1-2) :254-259
[2]   Surface treatment of indium tin oxide by SF6 plasma for organic light-emitting diodes [J].
Choi, B ;
Yoon, H ;
Lee, HH .
APPLIED PHYSICS LETTERS, 2000, 76 (04) :412-414
[3]   Stability of the interface between indium-tin-oxide and poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) in polymer light-emitting diodes [J].
de Jong, MP ;
van IJzendoorn, LJ ;
de Voigt, MJA .
APPLIED PHYSICS LETTERS, 2000, 77 (14) :2255-2257
[5]   Fine tuning work function of indium tin oxide by surface molecular design: Enhanced hole injection in organic electroluminescent devices [J].
Ganzorig, C ;
Kwak, KJ ;
Yagi, K ;
Fujihira, M .
APPLIED PHYSICS LETTERS, 2001, 79 (02) :272-274
[6]   SPATIAL-DISTRIBUTION AND SURFACE LOSS OF CF3 AND CF2 RADICALS IN A CF4 ETCHING PLASMA [J].
HIKOSAKA, Y ;
TOYODA, H ;
SUGAI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1993, 32 (3A) :L353-L356
[7]   Effects of inductively coupled plasma treatment using O2, CF4, and CH4 on the characteristics of organic light emitting diodes [J].
Jeong, Chang Hyun ;
Lee, June Hee ;
Lim, Jong Tae ;
Kim, Mi Suk ;
Yeom, Geun Young .
SURFACE & COATINGS TECHNOLOGY, 2007, 201 (9-11) :5012-5016
[8]   Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy [J].
Jo, Sung Jin ;
Kim, Chang Su ;
Ryu, Seung Yoon ;
Kim, Jong Bok ;
Noh, Joo Hyon ;
Lee, Se-Jong ;
Baik, Hong Koo .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (10A) :6814-6816
[9]  
Kim H, 2002, J KOREAN PHYS SOC, V41, P395
[10]   X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films [J].
Kim, JS ;
Ho, PKH ;
Thomas, DS ;
Friend, RH ;
Cacialli, F ;
Bao, GW ;
Li, SFY .
CHEMICAL PHYSICS LETTERS, 1999, 315 (5-6) :307-312