Nanocrystalline ZnO thin films are deposited through two different chemical methods: (i) the films prepared by ultrasonic spray with 0.1 M and (ii) dip-coating from zinc acetate complex solutions with 0.5 M, the films obtained at different temperatures. The XRD analyses indicated that ZnO films have nanocrystalline hexagonal structure with (0 0 2) preferential orientation and the Maximum crystallite size value of 103 nm measured from the films prepared by dip-coating. UV-vis measurement indicated that all films are transparency in the visible region. The optical band gap increased with decreasing of the Urbach tail energy indicating that the increase in the transition tail width and decrease of the defects, respectively. (C) 2012 Published by Elsevier GmbH.
机构:
Sun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China
Hong, Ruijiang
Xu, Shuhua
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S China Univ Technol, Sch Sci, Guangzhou 510641, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China
机构:
Sun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China
Hong, Ruijiang
Xu, Shuhua
论文数: 0引用数: 0
h-index: 0
机构:
S China Univ Technol, Sch Sci, Guangzhou 510641, Guangdong, Peoples R ChinaSun Yat Sen Univ, Sch Phys & Engn, Guangzhou 510275, Guangdong, Peoples R China