Semiclassical derivation of the surface-resistivity formula

被引：10

作者：

Ishida, H ^{[1
]}

机构：

[1] Nihon Univ, Coll Humanities & Sci, Setagaya Ku, Tokyo 156, Japan

来源：

PHYSICAL REVIEW B | 1999年 / 60卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.60.4532

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The contribution of the surface to the resistivity of metallic films is discussed in the limit of large film thickness by a simple semiclassical approach. The resistivity formula obtained coincides with a rigorous solution of the Boltzmann equation in the limit of large film thickness as well as with a more general resistivity expression which we recently derived for semi-infinite metallic systems by a quantum-mechanical linear-response method. [S0163-1829(99)02432-7].

引用

页码：4532 / 4534

页数：3

共 15 条

[11] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

[12] Dominance of phonon friction for a xenon film an a silver (111) surface [J].

Tomassone, MS ;

Sokoloff, JB ;

Widom, A ;

Krim, J .

PHYSICAL REVIEW LETTERS, 1997, 79 (24) :4798-4801

[13]

VANEK J, 1994, DEFECT DIFFUSION FOR, V116

[14]

VANEK J, 1994, DEFECT DIFFUSION FOR, V115

[15] EXPERIMENTAL-OBSERVATION OF INTERFACIAL SLIPPAGE AT THE BOUNDARY OF MOLECULARLY THIN-FILMS WITH GOLD SUBSTRATES [J].

WATTS, ET ;

KRIM, J ;

WIDOM, A .

PHYSICAL REVIEW B, 1990, 41 (06) :3466-3472

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