CREME: The 2011 Revision of the Cosmic Ray Effects on Micro-Electronics Code

被引：50

作者：

Adams, J. H., Jr. ^{[1
]}

Barghouty, A. F. ^{[1
]}

Mendenhall, M. H. ^{[2
]}

Reed, R. A. ^{[2
]}

Sierawski, B. D. ^{[2
]}

Warren, K. M. ^{[2
]}

Watts, J. W. ^{[1
]}

Weller, R. A. ^{[2
]}

机构：

[1] NASA, Marshall Space Flight Center, Huntsville, AL 35812 USA

[2] Vanderbilt Univ, Nashville, TN 37240 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2012年 / 59卷 / 06期

关键词：

Geant4; ionizing radiation; Monte Carlo methods; MRED; rate prediction; single event effects; space technology; RATE PREDICTION; SOLAR; MODEL; ENVIRONMENT; SIMULATION; EVENTS;

D O I：

10.1109/TNS.2012.2218831

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe a tool suite, CREME, which combines existing capabilities of CREME96 and CREME86 with new radiation environment models and new Monte Carlo computational capabilities for single event effects and total ionizing dose.

引用

页码：3141 / 3147

页数：7

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