Infrared optical properties of Mn1.56Co0.96Ni0.48O4 thin films prepared by chemical solution deposition

被引：19

作者：

Gao, Y. Q. ^{[1
]}

Huang, Z. M. ^{[1
]}

Hou, Y. ^{[1
]}

Wu, J. ^{[1
]}

Zhou, W. ^{[1
]}

Zhang, L. B. ^{[1
]}

Chu, J. H. ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2014年 / 114卷 / 03期

关键词：

TEMPERATURE-COEFFICIENT THERMISTORS; SPINEL OXIDES; THERMOPOWER;

D O I：

10.1007/s00339-013-7685-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

similar to 2 mu m thick Mn1.56Co0.96Ni0.48O4 (MCN) films have been prepared on a Al2O3 substrate by the chemical solution deposition method. X-ray diffraction and microstructure analyses show good crystallization and the thickness of the films is 2.12 mu m. Mid-infrared optical properties of MCN films have been investigated using transmission spectra and infrared spectroscopic ellipsometry. The optical band gap of the MCN film has been derived to be 0.64 eV by assuming a direct transition between valence and conduction bands. The optical constants and thickness of the thin films have been obtained by fitting the measured ellipsometric parameter data with the classical infrared model. The refractive index n of the MCN films decreases as the wavelength increases, but the extinction coefficient k monotonously increases in the wavelength range of 2-7 mu m. The maximal n value is 2.63, and the maximal k value is only 0.024. The above results are instructive for the applications of MCN films in infrared detecting.

引用

页码：829 / 832

页数：4

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