Surface segregation of aluminum atoms on Cu-9 at.% Al(111) studied by Auger electron spectroscopy and low energy electron diffraction

被引:19
作者
Yu, Yinghui [1 ]
Sagisaka, Keisuke
Fujita, Daisuke
机构
[1] Natl Inst Mat Sci, Adv Nano Characterizat Ctr, Tsukuba, Ibaraki 3050047, Japan
关键词
Auger electron spectroscopy; Low energy electron diffraction; Concentration; Annealing temperature; AL ALLOY; COPPER; TRANSITION; PHASE; LEED; SI;
D O I
10.1016/j.susc.2009.01.014
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Auger electron spectroscopy (AES) and low energy electron diffraction (LEED) were applied to investigate the segregation of aluminum atoms on a Cu-9 at.% Al(1 1 1) surface. We observed that the Al concentration in the top layer ranged between about 9 and 36 at.% after the sample we used was annealed at different temperatures. The phenomenon of Al atoms segregating on the surfaces was explained well by considering the diffusion length of Al atoms in bulk Cu. LEED measurements showed that (root 3 x root 3)R30 degrees structures grew as the concentration of A] atoms increased. The segregation phenomena on surfaces resulted in a stable two-dimensional Cu(67)Al(33) alloy phase in the top layer. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:723 / 726
页数:4
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