Surface tritium detection by Imaging Plate Technique

In order to extend the usefulness of the tritium imaging plate tochnique(TIPT), we have performed three tasks: (1) to establish a film insertion method to avoid the cross-contamination of the imaging plate (IP) via tritium transfer from tritiated samples, (2) to discriminate tritium activity from other high energy radiation source, also using the film insertion method, and finally (3) to demonstrate the applicability of the TIPT from minute tritium levels even at activities as low as a few Bq/cm(2).