Crystal structure and elementary electronic properties of Bi-stabilized α-In2Se3

被引:12
作者
Ji, Huiwen [1 ]
Reijnders, Anjan [2 ]
Liang, Tian [3 ]
Schoop, L. M. [1 ]
Burch, K. S. [2 ,4 ]
Ong, N. P. [3 ]
Cava, R. J. [1 ]
机构
[1] Princeton Univ, Dept Chem, Princeton, NJ 08540 USA
[2] Univ Toronto, Dept Phys & Inst Opt Sci, Toronto, ON M5S 1A7, Canada
[3] Princeton Univ, Dept Phys, Princeton, NJ 08540 USA
[4] Univ Toronto, Dept Mat Sci & Engn, Toronto, ON M53 3E4, Canada
基金
美国国家科学基金会;
关键词
Chalcogenides; Optical materials; X-ray diffraction; Electrical properties; Optical properties; X-RAY-DIFFRACTION; OPTICAL-PROPERTIES; GROWTH; IN2SE3; PHASE; PHOTOCONDUCTIVITY; SYSTEM;
D O I
10.1016/j.materresbull.2013.03.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The introduction of Bias a substitution for In at similar to 12% in In2Se3 stabilizes the alpha-polymorph and facilitates the crystal growth by the modified Bridgeman method. The crystal structure (R-3m, Z = 3, a = 3.9978(8) angstrom, c = 28.276(6) angstrom) and composition, (In0.88Bi0.12)(2)Se-3, of the crystals were determined by single crystal X-ray diffraction. The structure, of the tetradymite type, displays positional disorder within the middle Se layer. Optical measurements indicate that (In0.88Bi0.12)(2)Se-3 has an indirect band gap of about 1.19 eV, shown by electronic structure calculations to be from valence band states near the Gamma point to conduction band states at the L point. Resistivity and Hall effect measurements on Sn-doped crystals of composition (In0.88Bi0.115Sn0.005)(2)Se-3 show it to have a relatively high semiconducting resistivity, about 6 x 10(4) Omega cm at 300 K, with an n-type carrier concentration varying from 10(12)/cm(3) at 300 K to 10(15)/cm(3) at 400 K. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2517 / 2521
页数:5
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