Ultrafast Electrooptic Dual-comb Interferometry Over 40-nm Bandwidth

被引：0
作者：
Duran, V. [1 ]
Torres-Company, V. [1 ]
机构：
[1] Chalmers, MC2, Dept Microtechnol & Nanosci, SE-41296 Gothenburg, Sweden
来源：
2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2016年
关键词：
OPTICAL FREQUENCY COMBS; SPECTROSCOPY;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We combine dual-comb interferometry with coherent nonlinear spectral broadening. We show high-speed (sub-millisecond) mode-resolved electric-field complex measurements of 25 GHz electrooptic frequency combs spanning the whole C band (1530-1565 nm).
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页数：2
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