Low-threshold AlGaN-based UVB VCSELs enabled by post-growth cavity detuning

被引:12
作者
Cardinali, G. [1 ]
Hjort, F. [2 ]
Prokop, N. [1 ]
Enslin, J. [1 ]
Cobet, M. [1 ]
Bergmann, M. A. [2 ]
Gustavsson, J. [2 ]
Ciers, J. [2 ]
Haeusler, I. [3 ]
Kolbe, T. [4 ]
Wernicke, T. [1 ]
Haglund, A. [2 ]
Kneissl, M. [1 ]
机构
[1] Tech Univ Berlin, Inst Solid State Phys, Hardenbergstr 36, D-10623 Berlin, Germany
[2] Chalmers Univ Technol, Dept Microtechnol & Nanosci, S-41296 Gothenburg, Sweden
[3] Tech Univ Berlin, Inst Opt & Atom Phys, Hardenbergstr 36, D-10623 Berlin, Germany
[4] Ferdinand Braun Inst FBH, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany
基金
欧洲研究理事会; 瑞典研究理事会;
关键词
SURFACE-EMITTING LASERS; EXCIMER-LASER; LIGHT;
D O I
10.1063/5.0097903
中图分类号
O59 [应用物理学];
学科分类号
摘要
The performance of vertical-cavity surface-emitting lasers (VCSELs) is strongly dependent on the spectral detuning between the gain peak and the resonance wavelength. Here, we use angle-resolved photoluminescence spectroscopy to investigate the emission properties of AlGaN-based VCSELs emitting in the ultraviolet-B spectral range with different detuning between the photoluminescence peak of the quantum-wells and the resonance wavelength. Accurate setting of the cavity length, and thereby the resonance wavelength, is accomplished by using doping-selective electrochemical etching of AlGaN sacrificial layers for substrate removal combined with deposition of dielectric spacer layers. By matching the resonance wavelength to the quantum-wells photoluminescence peak, a threshold power density of 0.4 MW/cm(2) was achieved, and this was possible only for smooth etched surfaces with a root mean square roughness below 2 nm. These results demonstrate the importance of accurate cavity length control and surface smoothness to achieve low-threshold AlGaN-based ultraviolet VCSELs. (C) 2022 Author(s).
引用
收藏
页数:7
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