Carbon 1s X-ray photoelectron spectra of realistic samples of hydrogen-terminated and oxygen-terminated CVD diamond (111) and (001)

被引:32
作者
Kono, Shozo [1 ,2 ]
Kageura, Taisuke [3 ]
Hayashi, Yuya [3 ,8 ]
Ri, Sung-Gi [4 ]
Teraji, Tokuyuki [5 ]
Takeuchi, Daisuke [6 ]
Ogura, Masahiko [6 ]
Kodama, Hideyuki [7 ,10 ]
Sawabe, Atsuhito [7 ]
Inaba, Masafumi [3 ,9 ]
Hiraiwa, Atsushi [1 ,2 ]
Kawarada, Hiroshi [1 ,2 ,3 ]
机构
[1] Waseda Univ, Kagami Mem Res Inst Mat Sci & Technol, Shinjuku Ku, Tokyo 1690051, Japan
[2] Waseda Univ, Res Org Nano & Life Innovat, Shinjuku Ku, Tokyo 1620041, Japan
[3] Waseda Univ, Sch Sci & Engn, Shinjuku Ku, Tokyo 1698555, Japan
[4] Comet Inc, Tsukuba, Ibaraki 3002635, Japan
[5] NIMS, Tsukuba, Ibaraki 3050044, Japan
[6] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
[7] Aoyama Gakuin Univ, Dept Elect Engn & Elect, Sagamihara, Kanagawa 2525258, Japan
[8] ALPS Elect Co LTD, Tokyo, Japan
[9] Kyushu Univ, Fukuoka, Fukuoka, Japan
[10] Futaba Railway, Futaba, Japan
基金
日本学术振兴会;
关键词
Carbon; 1s core level; CVD diamond; X-ray photoelectron spectroscopy; Surface; Band bending; MEAN FREE PATHS; ELECTRON-AFFINITY; SURFACE CONDUCTIVITY; THERMAL-DESORPTION; C(111) SURFACE; WORK FUNCTION; XPS SPECTRA; CORE-LEVEL; PHOTOEMISSION; BAND;
D O I
10.1016/j.diamond.2019.01.017
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Key factors in C 1s photoelectron spectroscopy for realistic samples of single crystal diamonds are remarked. Basic equations for angle-dependent photoelectron spectroscopy applied to single crystal diamond samples are described in Appendix A. Carbon is photoelectron spectroscopic works so far reported for hydrogen-terminated and oxygen-terminated diamond (001) and (111) samples were reviewed placing special attention on surface C 1s components with reference to the key factors. The results showed diversity in C 1s photoelectron spectra so far reported. We had three specific subjects of the study in C 1s XPS; the first is that we have reconfirmed the phenomenon that surface conductive layers resumed when smooth non-doped CVD C(111)-O samples were annealed in vacuum [Diam.Rela.Mate.18(2009)206]. A single C 1s XPS surface component was found for a smooth C(111)-O sample before the vacuum-anneal, which was attributed to surface carbon atoms in C-O-H bonding. The second subject is that dependence of C 1s XPS spectra on surface sensitivity has been measured for all the samples with different surface roughness of C(001)-O, C(111)-O, C(001)-H, and C(111)-H. The results were converted to the energy difference between the Fermi-level (Ef) and valence band maximum (Ev) on the probing depth from the surface. All the samples showed downward bending of Ev toward the surface. For the C(001)-H samples, this was a reconfirmation of previous work [Surf.Sci.604(2010)1148]. For the C(001)-H and C(111)-H samples, various degrees of downward band bending toward surface were observed and analyzed with two-dimensional band simulation. It was concluded that another source of holes such as shallow acceptors is present in a deeper region of the surface in addition to holes very close to surface caused by the charge-transferdoping. The third subject is that C 1s XPS spectra for superconducting C(111)-O samples showed a lattice distortion of similar to 9 monolayers near the surface.
引用
收藏
页码:105 / 130
页数:26
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