Optical investigation of micrometer and nanometer-size individual GaN pillars fabricated by reactive ion etching

被引:30
作者
Demangeot, F [1 ]
Gleize, J
Frandon, J
Renucci, MA
Kuball, M
Peyrade, D
Manin-Ferlazzo, L
Chen, Y
Grandjean, N
机构
[1] Univ Toulouse 3, IRSAMC, CNRS, UMR 5477,Lab Phys Solides Toulouse, F-31062 Toulouse 04, France
[2] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England
[3] LPN, CNRS, F-91460 Marcoussis, France
[4] CNRS, CRHEA, F-06560 Valbonne, France
关键词
D O I
10.1063/1.1468908
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present an optical investigation of GaN pillars using both micro-Raman (mu-Raman) and microphotoluminescence (mu-PL) spectroscopy. GaN pillars of diameter ranging from 100 nm to 5 mum were fabricated by electron beam lithography and reactive ion etching (RIE) with SiCl4 plasma. Optical measurements of both mu-Raman and mu-PL on individual pillars show consistent variations in the properties of the fabricated GaN structures as a function of GaN pillar size. mu-PL mapping gives strong evidence for defect-induced donors and/or acceptors near the facets of the RIE etched pillars. RIE for the nanostructuration of GaN could be used in the future to allow spectroscopic studies of a few or single quantum objects such as GaN quantum dots. (C) 2002 American Institute of Physics.
引用
收藏
页码:6520 / 6523
页数:4
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