Measuring time of flight of fusion products in an inertial electrostatic confinement fusion device for spatial profiling of fusion reactions

被引:9
作者
Donovan, D. C. [1 ]
Boris, D. R. [2 ]
Kulcinski, G. L. [3 ]
Santarius, J. F. [3 ]
Piefer, G. R. [4 ]
机构
[1] Sandia Natl Labs, Livermore, CA 94550 USA
[2] USN, Res Lab, Washington, DC 20375 USA
[3] Univ Wisconsin, Fus Technol Inst, Madison, WI 53706 USA
[4] Phoenix Nucl Labs, Madison, WI 53713 USA
关键词
IEC;
D O I
10.1063/1.4793771
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A new diagnostic has been developed that uses the time of flight (TOF) of the products from a nuclear fusion reaction to determine the location where the fusion reaction occurred. The TOF diagnostic uses charged particle detectors on opposing sides of the inertial electrostatic confinement (IEC) device that are coupled to high resolution timing electronics to measure the spatial profile of fusion reactions occurring between the two charged particle detectors. This diagnostic was constructed and tested by the University of Wisconsin-Madison Inertial Electrostatic Confinement Fusion Group in the IEC device, HOMER, which accelerates deuterium ions to fusion relevant energies in a high voltage (similar to 100 kV), spherically symmetric, electrostatic potential well [J. F. Santarius, G. L. Kulcinski, R. P. Ashley, D. R. Boris, B. B. Cipiti, S. K. Murali, G. R. Piefer, R. F. Radel, T. E. Radel, and A. L. Wehmeyer, Fusion Sci. Technol. 47, 1238 (2005)]. The TOF diagnostic detects the products of D(d,p)T reactions and determines where along a chord through the device the fusion event occurred. The diagnostic is also capable of using charged particle spectroscopy to determine the Doppler shift imparted to the fusion products by the center of mass energy of the fusion reactants. The TOF diagnostic is thus able to collect spatial profiles of the fusion reaction density along a chord through the device, coupled with the center of mass energy of the reactions occurring at each location. This provides levels of diagnostic detail never before achieved on an IEC device. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793771]
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页数:7
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