The formation of B and Iw phases in the YSiAlON system:: influence of nitrogen content

被引:5
作者
Díaz, A [1 ]
Menke, Y
Hampshire, S
机构
[1] Univ Limerick, Mat Surface Sci Inst, Limerick, Ireland
[2] Univ Limerick, Ceram Res Unit, Limerick, Ireland
来源
NITRIDES AND OXYNITRIDES 2 | 2002年 / 383卷
关键词
oxynitride glass-ceramic; YSiAlON; B-phase; I-w-phase;
D O I
10.4028/www.scientific.net/MSF.383.79
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
YSiAlON glasses have been produced using a cation ratio of Y: Si: Al = 3.5: 3.38: 2 with a nitrogen content of 17% and Y: Si: Al = 3.45: 3: 2 with varying nitrogen contents (N=8, 10, 12, 14, 17, 20 V.). Crystal phase formation occurred after heat treatment of the glasses under nitrogen atmosphere for 10 hours in the temperature range 1050-1150degreesC. Glass-ceramics were characterised by X-ray diffraction (XRD) and certain mechanical properties measured. Depending upon heat treatment temperature and/or nitrogen content, either a single crystalline phase glass-ceramic or a multi-phase glass-ceramic containing B and I-w was produced. Low nitrogen contents (8(e)/(o) N) favour the crystallisation of I-w-phase over B-phase, whereas B-phase is formed more readily for higher nitrogen contents (17 (e)/(o) N).
引用
收藏
页码:79 / 85
页数:7
相关论文
共 13 条
[1]   A CRITICAL-EVALUATION OF INDENTATION TECHNIQUES FOR MEASURING FRACTURE-TOUGHNESS .1. DIRECT CRACK MEASUREMENTS [J].
ANSTIS, GR ;
CHANTIKUL, P ;
LAWN, BR ;
MARSHALL, DB .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1981, 64 (09) :533-538
[2]  
*ASTM, E49492 ASTM
[3]  
DREW RAL, 1981, P BR CERAM SOC, V31, P119
[4]  
FALK LKL, COMMUNICATION
[5]  
HAMPSHIRE S, 1985, PHYS CHEM GLASSES, V26, P182
[6]  
Leng-Ward G, 1989, Oxynitride glasses and their glassceramics derivaties. Glass and glass ceramics, P106
[7]   CRYSTALLIZATION IN Y-SI-AL-O-N GLASSES [J].
LENGWARD, G ;
LEWIS, MH .
MATERIALS SCIENCE AND ENGINEERING, 1985, 71 (1-2) :101-111
[8]   INDENTATION FRACTURE-TOUGHNESS OF SINTERED SILICON-CARBIDE IN THE PALMQVIST CRACK REGIME [J].
LI, Z ;
GHOSH, A ;
KOBAYASHI, AS ;
BRADT, RC .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1989, 72 (06) :904-911
[9]   X-ray data for new Y-Si-Al-O-N glass ceramics [J].
Liddell, K ;
Mandal, H ;
Thompson, DP .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1997, 17 (06) :781-787
[10]  
MacLaren I, 2001, J AM CERAM SOC, V84, P1601, DOI 10.1111/j.1151-2916.2001.tb00884.x