The input impedance of ultra-high frequency radio frequency identification tag varies with the received power on the chip. It will induce impedance mismatch between the receiver antenna and microchip, thus drastically affect the performance of communication. In this paper, a low cost and fully integrated automatic impedance matching system was presented to solve this problem. It consists of two control loops for independent control of the real and imaginary parts of impedance. The first control loop realizes resistance correction using a parallel LC tuning network, whereas the second control loop achieves reactance compensation using a series LC tuning network. In both loops, the mismatch information is detected for direct control of the variable elements, varactors, which are tuned in a sequential manner. For unambiguous control of the resistance correction, the sign of the intermediate reactance is used as a secondary control criterion to enforce operation into a stable region. The functionality of the proposed automatic matching system was verified for different input impedances of a specifically semi-ultra wideband ultra-high frequency radio frequency identification tag as the available input power varies. The results indicate that all matched impedances are clustered around the target impedance 50 + j0?O after acquisition of both loops. Copyright (C) 2012 John Wiley & Sons, Ltd.
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CEIT, P Manuel Lardizabal 13, San Sebastian 20018, SpainCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Garcia, J.
Arriola, A.
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Ikerlan, Arrasate Mondragon 20500, SpainCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Arriola, A.
Casado, F.
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Ikerlan, Arrasate Mondragon 20500, SpainCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Casado, F.
Chen, X.
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Univ London, London E1 4NS, EnglandCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Chen, X.
Sancho, J. I.
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CEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Tecnun Univ Navarra, San Sebastian 20018, SpainCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Sancho, J. I.
Valderas, D.
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CEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
Tecnun Univ Navarra, San Sebastian 20018, SpainCEIT, P Manuel Lardizabal 13, San Sebastian 20018, Spain
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Korea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South KoreaKorea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South Korea
Choi, B-O
Kim, C. H.
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Korea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South KoreaKorea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South Korea
Kim, C. H.
Kim, D. S.
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Korea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South KoreaKorea Inst Machinery & Mat, Nanomech Syst Res Div, Taejon 305343, South Korea
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King Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi ArabiaKing Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi Arabia
Ashraf, Muhammad A.
AlShareef, Mohammed R.
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King Abdulaziz City Sci & Technol, Natl Ctr Elect & Photon Technol, Riyadh, Saudi ArabiaKing Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi Arabia
AlShareef, Mohammed R.
Behairy, Hatim
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King Abdulaziz City Sci & Technol, Natl Ctr Elect & Photon Technol, Riyadh, Saudi ArabiaKing Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi Arabia
Behairy, Hatim
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Alshebeili, Saleh
Fathallah, Habib
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King Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi Arabia
Carthage Univ, Coll Sci Bizerte, Comp Dept, Tunis, TunisiaKing Saud Univ, Elect Engn Dept, KACST TIC Radio Frequency & Photon Soc RFTONICS, Riyadh, Saudi Arabia