Influence of misfit strain on the physical properties of Fe thin films

被引：5

作者：

Ravensburg, Anna L. ^{[1
]}

Palsson, Gunnar K. ^{[1
]}

Pohlit, Merlin ^{[1
]}

Hjoervarsson, Bjoergvin ^{[1
]}

Kapaklis, Vassilios ^{[1
]}

机构：

[1] Uppsala Univ, Dept Phys & Astron, Box 516, SE-75120 Uppsala, Sweden

来源：

THIN SOLID FILMS | 2022年 / 761卷

基金：

瑞典研究理事会;

关键词：

Thin film growth; Crystal quality; X-ray diffraction; Electronic transport; Magnetism; Critical thickness; Strain; X-RAY-DIFFRACTION; MAGNETIC-PROPERTIES; ROOM-TEMPERATURE; MGO; GROWTH; MAGNETORESISTANCE; RESISTIVITY; THICKNESS; QUALITY;

D O I：

10.1016/j.tsf.2022.139494

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigate the growth of thin Fe layers on MgAl2O4 (001) and MgO (001) substrates using dc magnetron sputtering. The crystal quality of Fe layers deposited on MgAl2O4 is found to be substantially higher as compared to Fe grown on MgO substrates. The effects of the crystal quality on the magnetic and electronic transport properties are discussed.

引用

页数：7

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