In-situ μ-Raman spectroscopy in femtosecond irradiated material

被引：1

作者：

Ramme, Mark ^{[1
]}

Cox, Jordan ^{[1
]}

Hemmer, Michael ^{[1
]}

Anderson, Troy ^{[1
]}

Richardson, Martin ^{[1
]}

机构：

[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA

来源：

2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 | 2007年

关键词：

D O I：

10.1109/LEOS.2007.4382297

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An in-situ mu-Raman spectroscope is presented. The possibilities of obtaining Raman spectra at various pump frequencies without an expensive ultra-notch filter is discussed, including measurements of various materials like Chalcogenide glasses, Telluride glasses and semiconductors.

引用

页码：104 / 105

页数：2

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