Thin metal films deposited on dendrimer monolayers

被引：15
作者：
Rar, A
Curry, M
Barnard, JA
Street, SC
机构：
[1] Univ Alabama, Dept Chem, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
[2] Univ Alabama, Dept Met & Mat Engn, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
来源：
TRIBOLOGY LETTERS | 2002年 / 12卷 / 02期
关键词：
PAMAM dendrimer; thin films; Co; Cr; nitride; XPS; AFM;
D O I：
10.1023/A:1014078112454
中图分类号：
TQ [化学工业];
学科分类号：
0817 ;
摘要：
Chemical interactions and the evolution of surface morphology resulting from deposition of Cr and Cc onto dendrimer monolayers have been investigated by XPS, RAIRS, and AFM. Evidence is presented for formation of metal nitrides and mediation of film morphology as a function of the metal and generation number of the dendrimer comprising the monolayer.
引用
收藏
页码：87 / 94
页数：8
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